Abstract
The polarization conversion of a twisted nematic liquid crystal device
can be completely characterized by the physical parameters, including the
cell parameters and equivalent birefringent parameters. Periodic ambiguity
is unavoidable in the measurement; therefore, the exact values of these parameters
cannot be uniquely determined. To solve this problem, phase-shift imaging
polarimetry is developed to measure the spatial distribution of the physical
parameters of a twisted nematic liquid crystal device without periodic ambiguity.
The proposed method experimentally showed that as few as eight intensity images
are adequate to uniquely determine all of the physical parameters based on
an analytical approach.
© 2014 IEEE
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