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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 4, Iss. 2 — Jun. 1, 2008
  • pp: 229–232

A Testing Method on Poly-Si Thin-Film Transistor Array for Active-Matrix Organic Emitting Display

Xueqiang Liu, Tong Zhang, Lijie Wang, Zhiqiang Xia, Mingyou Li, and Shiyong Liu

Journal of Display Technology, Vol. 4, Issue 2, pp. 229-232 (2008)


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Abstract

A novel method is introduced using to evaluate the quality of thin-film transistor (TFT) array for driving active-matrix display (OLED). By the means of this method, the operation states of the TFT or the defects of TFT can be judged. It is a current testing method with the advantages of fast response, excellent precision, no effect to aperture and no damage to the display array.

© 2008 IEEE

Citation
Xueqiang Liu, Tong Zhang, Lijie Wang, Zhiqiang Xia, Mingyou Li, and Shiyong Liu, "A Testing Method on Poly-Si Thin-Film Transistor Array for Active-Matrix Organic Emitting Display," J. Display Technol. 4, 229-232 (2008)
http://www.opticsinfobase.org/jdt/abstract.cfm?URI=jdt-4-2-229


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References

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