A novel method is introduced using to evaluate the quality of thin-film transistor (TFT) array for driving active-matrix display (OLED). By the means of this method, the operation states of the TFT or the defects of TFT can be judged. It is a current testing method with the advantages of fast response, excellent precision, no effect to aperture and no damage to the display array.
© 2008 IEEE
Xueqiang Liu, Tong Zhang, Lijie Wang, Zhiqiang Xia, Mingyou Li, and Shiyong Liu, "A Testing Method on Poly-Si Thin-Film Transistor Array for Active-Matrix Organic Emitting Display," J. Display Technol. 4, 229-232 (2008)