OSA's Digital Library

Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 8, Iss. 7 — Jul. 1, 2012
  • pp: 385–390

Stability of ITO Thin Film on Flexible Substrate Under Thermal Aging and Thermal Cycling Conditions

Mohammad M. Hamasha, Tara Dhakal, Khalid Alzoubi, Shehab Albahri, Awni Qasaimeh, Susan Lu, and Charles R. Westgate

Journal of Display Technology, Vol. 8, Issue 7, pp. 385-390 (2012)


View Full Text Article

Acrobat PDF (1201 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

Indium–tin–oxide (ITO) is a transparent conductive thin film that is widely used as a top conducive layer in photovoltaic solar cells. However, ITO is sensitive to environmental conditions and the electrical conductivity degrades as a consequence of harsh environmental conditions. Furthermore, the thermal expansion coefficient mismatch between the ITO film and the substrate creates stress/strain on the film when the package is subjected to fluctuating temperatures. This could create micro-cracks and consequently damage the film. Therefore, this study was designed to study the effect of the thermal cycling and thermal aging on the ITO thin films to simulate the effect of continuous high temperatures and fluctuating temperatures that may be applied on the thin films during the usage. In this study, two sets of experiments were conducted on a ${\hbox{60}}~\Omega/\square$ sputter-deposited ITO on ${\hbox{127}}~\mu{\hbox{m}}$ heat stabilized Poly Ethylene Terephthalate (PET) substrate. The first set of experiments contained four samples which were thermally aged at ${\hbox{100}}\ ^{\circ}{\hbox{C}}$ for 30 days and the other set of experiments contained another four samples which were thermally cycled for 900 cycles. The thermal profile consisted of a high temperature of ${\hbox{100}}\ ^{\circ}{\hbox{C}}$, a low temperature of ${\hbox{0}}\ ^{\circ}{\hbox{C}}$, dwell time of 10 minutes, and ramp rate of ${\hbox{10}}^{\circ}{\hbox{C}}/{\min}$, as depicted in Fig. 1 . The initial results showed that the ITO thin film is not stable in the thermal aging experiment and the electrical resistivity gradually increased for all samples until the end of the 30 days. The degradation happened during the thermal cycling as well. However, SEM images show that the morphology of the ITO surface is stable under both conditions. Energy-dispersive X-ray (EDX) spectroscopy analysis showed stability in the ITO thin film in terms of composition. XRD spectra confirmed the improved crystallinity for the thermally aged films, which corresponded to the increased transmission in the visible region.

© 2012 IEEE

Citation
Mohammad M. Hamasha, Tara Dhakal, Khalid Alzoubi, Shehab Albahri, Awni Qasaimeh, Susan Lu, and Charles R. Westgate, "Stability of ITO Thin Film on Flexible Substrate Under Thermal Aging and Thermal Cycling Conditions," J. Display Technol. 8, 385-390 (2012)
http://www.opticsinfobase.org/jdt/abstract.cfm?URI=jdt-8-7-385

You do not have subscription access to this journal. Citation lists with outbound citation links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an OSA member, or as an authorized user of your institution.

Contact your librarian or system administrator
or
Log in to access OSA Member Subscription

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited