Abstract
Current-programmed active matrix (AM) architectures that are independent
of fabrication technology are attractive for display and sensor because of
their ability to tolerate mismatches and nonuniformity caused by aging. However,
the long settling time due to low current levels and large parasitic capacitance
can be a significant limitation. In this paper, we present a fast current-mode
line driver based on positive feedback which controls the effect of parasitic
capacitance. The driver was fabricated in 0.8-$\mu$m 20-V CMOS technology. While the
measured settling time of a conventional current source is around 2 ms for
a 100-nA input current and 200-pF parasitic capacitance, it is less than 4 $\mu$s for the driver
presented here. Moreover, an offset-leakage cancellation technique is implemented
for the fabricated driver to reduce the effect of leakage and offset currents
to few nA.
© 2009 IEEE
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