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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

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Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology


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  • Optics Letters, Vol. 39, Issue 21, pp. 6174-6176 (November 2014)
  • Ting Qing, Min Xue, Menghao Huang, Shilong Pan

  • Optics Express, Vol. 22, Issue 21, pp. 25043-25052 (October 2014)
  • S. C. Burd, P. J. W. du Toit, H. Uys

  • Optics Express, Vol. 22, Issue 21, pp. 25071-25083 (October 2014)
  • Peter Meindl, Martin Wähmer, Christian Monte

  • Optics Express, Vol. 22, Issue 21, pp. 25385-25396 (October 2014)
  • Martin Stubenvoll, Bernd Schäfer, Klaus Mann

  • Optics Express, Vol. 22, Issue 21, pp. 25466-25480 (October 2014)
  • Thomas O. H. Charrett, Ralph P. Tatam

  • Optics Express, Vol. 22, Issue 21, pp. 25587-25598 (October 2014)
  • Enzheng Zhang, Qun Hao, Benyong Chen, Liping Yan, Yanna Liu

  • Optics Express, Vol. 22, Issue 22, pp. 26752-26762 (November 2014)
  • William Lohry, Song Zhang

  • Optics Express, Vol. 22, Issue 22, pp. 27669-27674 (November 2014)
  • Yuhang He, Bo Gao, Kaiyuan Xu, Ang Liu, Qiang Li, Liqun Chai

  • Optics Express, Vol. 22, Issue 23, pp. 28276-28283 (November 2014)
  • Peng Qin, Youjian Song, Hyoji Kim, Junho Shin, Dohyeon Kwon, Minglie Hu, Chingyue Wang, Jungwon Kim

  • Optics Express, Vol. 22, Issue 24, pp. 29787-29798 (December 2014)
  • Holger Knell, Sören Laubach, Gerd Ehret, Peter Lehmann

  • Optics Express, Vol. 22, Issue 24, pp. 30004-30012 (December 2014)
  • P. N. Juranić, A. Stepanov, R. Ischebeck, V. Schlott, C. Pradervand, L. Patthey, M. Radović, I. Gorgisyan, L. Rivkin, C. P. Hauri, B. Monoszlai, R. Ivanov, P. Peier, J. Liu, T. Togashi, S. Owada, K. Ogawa, T. Katayama, M. Yabashi, R. Abela

  • Applied Optics, Vol. 53, Issue 30, pp. 6993-6998 (October 2014)
  • Octavio Olvera-R, Moisés Cywiak, Joel Cervantes-L, David Cywiak

  • Applied Optics, Vol. 53, Issue 30, pp. 7138-7143 (October 2014)
  • Max Schiemangk, Stefan Spießberger, Andreas Wicht, Götz Erbert, Günther Tränkle, Achim Peters

  • Applied Optics, Vol. 53, Issue 31, pp. 7182-7188 (November 2014)
  • Nathan Grady, Robert W. Pitz

  • Applied Optics, Vol. 53, Issue 31, pp. 7407-7414 (November 2014)
  • Fang Tang, Yun Wang, Lirong Qiu, Weiqian Zhao, Yingbin Sun

  • Applied Optics, Vol. 53, Issue 31, pp. 7534-7539 (November 2014)
  • Reena Disawal, Jitendra Dhanotia, Shashi Prakash

  • Applied Optics, Vol. 53, Issue 31, pp. 7603-7609 (November 2014)
  • Abdurahim Rakhman, Yang Wang, Frances Garcia, Cary Long, Chunning Huang, Yasuhiro Takeda, Yun Liu

  • Applied Optics, Vol. 53, Issue 33, pp. 7942-7950 (November 2014)
  • Beiwen Li, Song Zhang

  • Applied Optics, Vol. 53, Issue 34, pp. 8020-8031 (December 2014)
  • Yanyan Zhao, Yan Yuan

  • Biomedical Optics Express, Vol. 5, Issue 12, pp. 4374-4386 (December 2014)
  • Jinxin Huang, Qun Yuan, Buyun Zhang, Ke Xu, Patrice Tankam, Eric Clarkson, Matthew A. Kupinski, Holly B. Hindman, James V. Aquavella, Thomas J. Suleski, Jannick P. Rolland
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