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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

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Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology


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  • JOSA A, Vol. 31, Issue 7, pp. 1427-1435 (July 2014)
  • Ziyue Zhao, Jigui Zhu, Bin Xue, Linghui Yang

  • JOSA B, Vol. 31, Issue 7, pp. 1494-1498 (July 2014)
  • Bertúlio de Lima Bernardo

  • Optics Letters, Vol. 39, Issue 13, pp. 3872-3875 (July 2014)
  • Ying Wang, D. N. Wang, Fan Yang, Zhi Li, Minghong Yang

  • Optics Letters, Vol. 39, Issue 13, pp. 4009-4012 (July 2014)
  • Guangming Tao, Soroush Shabahang, He Ren, Farnood Khalilzadeh-Rezaie, Robert E. Peale, Zhiyong Yang, Xunsi Wang, Ayman F. Abouraddy

  • Optics Letters, Vol. 39, Issue 14, pp. 4267-4270 (July 2014)
  • Shuman Xia, Zhipeng Pan, Jingwen Zhang

  • Optics Letters, Vol. 39, Issue 15, pp. 4412-4415 (August 2014)
  • Ju Wang, Jinlong Yu, Wang Miao, Bin Sun, Shi Jia, Wenrui Wang, Qiong Wu

  • Optics Express, Vol. 22, Issue 14, pp. 16819-16828 (July 2014)
  • Yong Xu, Shuhai Jia, Qingchen Bao, Hualing Chen, Jia Yang

  • Optics Express, Vol. 22, Issue 14, pp. 16991-17005 (July 2014)
  • Tomasz Kozacki, Kamil Liżewski, Julianna Kostencka

  • Optics Express, Vol. 22, Issue 14, pp. 17423-17429 (July 2014)
  • J. Goodfellow, M. Fuchs, D. Daranciang, S. Ghimire, F. Chen, H. Loos, D. A. Reis, A. S. Fisher, A. M. Lindenberg

  • Optics Express, Vol. 22, Issue 14, pp. 17466-17477 (July 2014)
  • Ryan J. Suess, Mohammad M. Jadidi, Kyowon Kim, Thomas E. Murphy

  • Optics Express, Vol. 22, Issue 15, pp. 17948-17958 (July 2014)
  • Peter Hermann, Arne Hoehl, Georg Ulrich, Claudia Fleischmann, Antje Hermelink, Bernd Kästner, Piotr Patoka, Andrea Hornemann, Burkhard Beckhoff, Eckart Rühl, Gerhard Ulm

  • Optics Express, Vol. 22, Issue 15, pp. 18168-18176 (July 2014)
  • Silvie Ngo, Terry G. McRae, Malcolm B. Gray, Daniel A. Shaddock

  • Optics Express, Vol. 22, Issue 15, pp. 18214-18223 (July 2014)
  • Thomas S. Schwarze, Oliver Gerberding, Felipe Guzmán Cervantes, Gerhard Heinzel, Karsten Danzmann

  • Applied Optics, Vol. 53, Issue 19, pp. 4128-4135 (July 2014)
  • Yedhu Krishna, Sean O’Byrne, Joseph John Kurtz

  • Applied Optics, Vol. 53, Issue 19, pp. 4216-4227 (July 2014)
  • Bing Pan, Liping Yu, Dafang Wu

  • Applied Optics, Vol. 53, Issue 20, pp. 4363-4374 (July 2014)
  • Thomas O. H. Charrett, Ian A. Bledowski, Stephen W. James, Ralph P. Tatam

  • Applied Optics, Vol. 53, Issue 20, pp. 4405-4412 (July 2014)
  • Hanlin Zhang, Yongjie Ren, Changjie Liu, Jigui Zhu

  • Applied Optics, Vol. 53, Issue 20, pp. 4450-4459 (July 2014)
  • Ki-Chul Kwon, Ji-Seong Jeong, Munkh-Uchral Erdenebat, Young-Tae Lim, Kwan-Hee Yoo, Nam Kim

  • Applied Optics, Vol. 53, Issue 20, pp. 4604-4610 (July 2014)
  • Jong-Ahn Kim, Chu-Shik Kang, Tae Bong Eom, Jonghan Jin, Ho Suhng Suh, Jae Wan Kim

  • Applied Optics, Vol. 53, Issue 22, pp. 4881-4885 (August 2014)
  • Lyle E. Roberts, Robert L. Ward, Andrew J. Sutton, Roland Fleddermann, Glenn de Vine, Emmanuel A. Malikides, Danielle M. R. Wuchenich, David E. McClelland, Daniel A. Shaddock
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