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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

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Instrumentation, measurement, and metrology : Instrumentation, measurement, and metrology


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  • JOSA A, Vol. 31, Issue 7, pp. 1427-1435 (July 2014)
  • Ziyue Zhao, Jigui Zhu, Bin Xue, Linghui Yang

  • JOSA B, Vol. 31, Issue 7, pp. 1494-1498 (July 2014)
  • Bertúlio de Lima Bernardo

  • Optics Letters, Vol. 39, Issue 12, pp. 3406-3409 (June 2014)
  • Luis Rodriguez, Jaime F. Cárdenas-García, César Costa Vera

  • Optics Letters, Vol. 39, Issue 13, pp. 3872-3875 (July 2014)
  • Ying Wang, D. N. Wang, Fan Yang, Zhi Li, Minghong Yang

  • Optics Letters, Vol. 39, Issue 13, pp. 4009-4012 (July 2014)
  • Guangming Tao, Soroush Shabahang, He Ren, Farnood Khalilzadeh-Rezaie, Robert E. Peale, Zhiyong Yang, Xunsi Wang, Ayman F. Abouraddy

  • Optics Express, Vol. 22, Issue 12, pp. 14958-14963 (June 2014)
  • Maxim Ryabko, Sergey Koptyaev, Alexander Shcherbakov, Alexey Lantsov, S. Y. Oh

  • Optics Express, Vol. 22, Issue 12, pp. 15111-15117 (June 2014)
  • Ninghua Zhu, Youwan Tong, Wei Chen, Sunlong Wang, Wenhui Sun, Jianguo Liu

  • Optics Express, Vol. 22, Issue 12, pp. 15165-15177 (June 2014)
  • Xiuguo Chen, Shiyuan Liu, Chuanwei Zhang, Hao Jiang, Zhichao Ma, Tangyou Sun, Zhimou Xu

  • Optics Express, Vol. 22, Issue 13, pp. 16528-16537 (June 2014)
  • Christophe Gosset, Ivan Aldaya, Cheng Wang, Heming Huang, Xin You, Jacky Even, Gabriel Campuzano, Frédéric Grillot

  • Optics Express, Vol. 22, Issue 14, pp. 16819-16828 (July 2014)
  • Yong Xu, Shuhai Jia, Qingchen Bao, Hualing Chen, Jia Yang

  • Optics Express, Vol. 22, Issue 14, pp. 16991-17005 (July 2014)
  • Tomasz Kozacki, Kamil Liżewski, Julianna Kostencka

  • Optics Express, Vol. 22, Issue 14, pp. 17423-17429 (July 2014)
  • J. Goodfellow, M. Fuchs, D. Daranciang, S. Ghimire, F. Chen, H. Loos, D. A. Reis, A. S. Fisher, A. M. Lindenberg

  • Optics Express, Vol. 22, Issue 14, pp. 17466-17477 (July 2014)
  • Ryan J. Suess, Mohammad M. Jadidi, Kyowon Kim, Thomas E. Murphy

  • Applied Optics, Vol. 53, Issue 19, pp. 4128-4135 (July 2014)
  • Yedhu Krishna, Sean O’Byrne, Joseph John Kurtz

  • Applied Optics, Vol. 53, Issue 19, pp. 4216-4227 (July 2014)
  • Bing Pan, Liping Yu, Dafang Wu

  • Applied Optics, Vol. 53, Issue 20, pp. 4363-4374 (July 2014)
  • Thomas O. H. Charrett, Ian A. Bledowski, Stephen W. James, Ralph P. Tatam

  • Applied Optics, Vol. 53, Issue 20, pp. 4405-4412 (July 2014)
  • Hanlin Zhang, Yongjie Ren, Changjie Liu, Jigui Zhu

  • Applied Optics, Vol. 53, Issue 20, pp. 4450-4459 (July 2014)
  • Ki-Chul Kwon, Ji-Seong Jeong, Munkh-Uchral Erdenebat, Young-Tae Lim, Kwan-Hee Yoo, Nam Kim

  • Applied Optics, Vol. 53, Issue 20, pp. 4604-4610 (July 2014)
  • Jong-Ahn Kim, Chu-Shik Kang, Tae Bong Eom, Jonghan Jin, Ho Suhng Suh, Jae Wan Kim

  • Chinese Optics Letters, Vol. 12, Issue 7, pp. 071201- (July 2014)
  • Tong Zhang, Qibo Feng, Cunxing Cui, Bin Zhang
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