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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

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Instrumentation, measurement, and metrology : Remote sensing and sensors


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  • Optics Letters, Vol. 40, Issue 6, pp. 890-893 (March 2015)
  • Dmitry A. Kuzmin, Igor V. Bychkov, Vladimir G. Shavrov

  • Optics Express, Vol. 22, Issue 21, pp. 26055-26075 (October 2014)
  • Jeffrey R. Chen, Kenji Numata, Stewart T. Wu

  • Optics Express, Vol. 22, Issue 22, pp. 27270-27280 (November 2014)
  • Huazhong Ren, Chen Du, Rongyuan Liu, Qiming Qin, Guangjian Yan, Zhao-Liang Li, Jinjie Meng

  • Optics Express, Vol. 22, Issue 23, pp. 27833-27844 (November 2014)
  • Fuchao Liu, Fan Yi

  • Optics Express, Vol. 23, Issue 3, pp. 2660-2675 (February 2015)
  • Jeffrey R. Chen, Kenji Numata, Stewart T. Wu

  • Optics Express, Vol. 23, Issue 4, pp. 5078-5090 (February 2015)
  • Julia Toussaint, Sebastian Dochow, Ines Latka, Aleksandar Lukic, Torsten May, Hans-Georg Meyer, Konstantin Il’in, Michael Siegel, Jürgen Popp

  • Optics Express, Vol. 23, Issue 4, pp. 5312-5316 (February 2015)
  • Ibrahim Ozdur, Paul Toliver, T. K. Woodward

  • Optics Express, Vol. 23, Issue 6, pp. 7755-7766 (March 2015)
  • Ahmed Arafa, Sumant Dalmiya, Richard Klukas, Jonathan F. Holzman

  • Optics Express, Vol. 23, Issue 7, pp. A346-A360 (April 2015)
  • Huazhong Ren, Rongyuan Liu, Guangjian Yan, Zhao-Liang Li, Qiming Qin, Qiang Liu, Françoise Nerry

  • Applied Optics, Vol. 53, Issue 31, pp. 7312-7320 (November 2014)
  • Yunpeng Zhang, Fan Yi, Wei Kong, Yang Yi

  • Applied Optics, Vol. 53, Issue 31, pp. 7551-7555 (November 2014)
  • Juan Montoya, Antonio Sanchez-Rubio, Robert Hatch, Harold Payson

  • Applied Optics, Vol. 53, Issue 32, pp. 7778-7786 (November 2014)
  • Javier Pacheco-Labrador, Alejandro Ferrero, M. Pilar Martín

  • Applied Optics, Vol. 53, Issue 36, pp. 8436-8443 (December 2014)
  • João M. S. Sakamoto, Gefeson M. Pacheco, Cláudio Kitano, Bernhard R. Tittmann

  • Applied Optics, Vol. 53, Issue 36, pp. 8535-8543 (December 2014)
  • Monique Walker, Demetrius Venable, David N. Whiteman

  • Applied Optics, Vol. 53, Issue 36, pp. 8571-8584 (December 2014)
  • Junqiang Sun, Menghua Wang

  • Applied Optics, Vol. 54, Issue 2, pp. 141-149 (January 2015)
  • M. A. Rodríguez-Conejo, Juan Meléndez

  • Applied Optics, Vol. 54, Issue 6, pp. 1505-1514 (February 2015)
  • Dennis Muyimbwa, Øyvind Frette, Jakob J. Stamnes, Taddeo Ssenyonga, Yi-Chun Chen, Børge Hamre

  • Applied Optics, Vol. 54, Issue 8, pp. 1872-1889 (March 2015)
  • R. J. Sica, A. Haefele

  • Applied Optics, Vol. 54, Issue 8, pp. 1984-2006 (March 2015)
  • Robert E. Eplee, Kevin R. Turpie, Gerhard Meister, Frederick S. Patt, Bryan A. Franz, Sean W. Bailey

  • Applied Optics, Vol. 54, Issue 8, pp. C14-C22 (March 2015)
  • M. E. Gehm, D. J. Brady
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