Terahertz magneto-optical polarization modulation spectroscopy

• Abstract

• JOSA B, Vol. 29, Issue 6, pp. 1406-1412 (June 2012)
• Deepu K. George, Andreas V. Stier, Chase T. Ellis, Bruce D. McCombe, John Černe, Andrea G. Markelz

Single-shot full-field interferometric polarimeter with an integrated calibration scheme

• Abstract

• Optics Letters, Vol. 37, Issue 15, pp. 3282-3284 (August 2012)
• Dinesh N. Naik, Rakesh Kumar Singh, Hitoshi Itou, Maruthi M. Brundavanam, Yoko Miyamoto, Mitsuo Takeda

Stokes vector characterization of the polarization behavior of vertical-cavity surface-emitting lasers

• Abstract

• Optics Letters, Vol. 37, Issue 22, pp. 4799-4801 (November 2012)
• Andreas Molitor, Sébastien Hartmann, Wolfgang Elsäßer

Sensitivity enhancement for evanescent-wave sensing using cavity-ring-down ellipsometry

• Abstract

• Optics Letters, Vol. 38, Issue 8, pp. 1224-1226 (April 2013)
• Dimitris Sofikitis, Katerina Stamataki, Michael A. Everest, Vassilis Papadakis, Jean-Louis Stehle, Benoit Loppinet, T. Peter Rakitzis

Snapshot Mueller matrix spectropolarimeter: erratum

• Abstract

• Optics Letters, Vol. 38, Issue 10, pp. 1675-1675 (May 2013)
• Nathan Hagen, Kazuhiko Oka, Eustace L. Dereniak

Optimum selection of input polarization states in determining the sample Mueller matrix: a dual photoelastic polarimeter approach

• Abstract
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• Optics Express, Vol. 20, Issue 18, pp. 20466-20481 (August 2012)
• D. Layden, M. F. G. Wood, I. A. Vitkin

Measurement errors induced by deformation of optical axes of achromatic waveplate retarders in RRFP Stokes polarimeters

• Abstract
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• Optics Express, Vol. 20, Issue 24, pp. 26649-26666 (November 2012)
• Hui Dong, Ming Tang, Yandong Gong

Correction to article “Ellipsometry with randomly varying polarization states”

• Abstract
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• Optics Express, Vol. 20, Issue 28, pp. 29308-29308 (December 2012)
• Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, Fred Bijkerk

Tilt-ellipsometry of object surface by specular reflection for three-dimensional shape measurement

• Abstract
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• Optics Express, Vol. 21, Issue 5, pp. 6625-6632 (March 2013)
• Toshihide Tsuru

Overdetermined broadband spectroscopic Mueller matrix polarimeter designed by genetic algorithms

• Abstract
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• Optics Express, Vol. 21, Issue 7, pp. 8753-8762 (April 2013)
• Lars Martin Sandvik Aas, Pål Gunnar Ellingsen, Bent Even Fladmark, Paul Anton Letnes, Morten Kildemo

Noise properties of uniformly-rotating RRFP Stokes polarimeters

• Abstract
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• Optics Express, Vol. 21, Issue 8, pp. 9674-9690 (April 2013)
• Hui Dong, Ming Tang, Yandong Gong

Autocalibrating Stokes polarimeter for materials characterization

• Abstract

• Applied Optics, Vol. 51, Issue 18, pp. 4113-4119 (June 2012)
• Masaya Shinki, Mario T. Ivanov, Joshua S. Post, Svein Vagle, Jay T. Cullen, Dennis K. Hore

White-light ellipsometer with geometric phase shifter

• Abstract

• Applied Optics, Vol. 51, Issue 21, pp. 5060-5065 (July 2012)
• Lionel R. Watkins, Maxime Derbois

Dual-modulator broadband infrared Mueller matrix ellipsometry

• Abstract

• Applied Optics, Vol. 51, Issue 21, pp. 5100-5110 (July 2012)
• Liam J. K. Cross, Dennis K. Hore

Snapshot imaging polarimeter using modified Savart polariscopes

• Abstract

• Applied Optics, Vol. 51, Issue 24, pp. 5791-5796 (August 2012)
• Qizhi Cao, Chunmin Zhang, Edward DeHoog

Mueller matrix polarimetry with four photoelastic modulators: theory and calibration

• Abstract

• Applied Optics, Vol. 51, Issue 28, pp. 6805-6817 (October 2012)
• Oriol Arteaga, John Freudenthal, Baoliang Wang, Bart Kahr

Analytical approach for unique determination of cell parameters and equivalent birefringent parameters of a generally twisted nematic liquid crystal device

• Abstract

• Applied Optics, Vol. 51, Issue 33, pp. 7910-7919 (November 2012)
• Chih-Jen Yu, Yao-Teng Tseng, Kuei-Chu Hsu, Chien Chou

Monitoring adsorption and sedimentation using evanescent-wave cavity ringdown ellipsometry

• Abstract

• Applied Optics, Vol. 52, Issue 5, pp. 1086-1093 (February 2013)
• Katerina Stamataki, Vassilis Papadakis, Michael A. Everest, Stelios Tzortzakis, Benoit Loppinet, T. Peter Rakitzis

Real-time Measurement of Full Field Retardation Near Quarter Wavelength

• Abstract
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• Journal of the Optical Society of Korea, Vol. 16, Issue 4, pp. 457-461 (December 2012)
• Longhai Liu, Aijun Zeng, Qiao Yuan, Linglin Zhu, Ruifang Fang, Huijie Huang

Optical activity in sub-wavelength metallic grids and fishnet metamaterials in the conical mount

• Abstract
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• Optical Materials Express, Vol. 3, Issue 4, pp. 439-451 (April 2013)
• Thomas W. H. Oates, Babak Dastmalchi, Christian Helgert, Lars Reissmann, Uwe Huebner, Ernst-Bernhard Kley, Marc A. Verschuuren, Iris Bergmair, Thomas Pertsch, Kurt Hingerl, Karsten Hinrichs