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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

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Instrumentation, measurement, and metrology : Fabry-Perot


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  • JOSA A, Vol. 31, Issue 3, pp. 505-509 (March 2014)
  • Pavel Ionov

  • Optics Letters, Vol. 38, Issue 24, pp. 5385-5388 (December 2013)
  • Farzia Karim, Tanujjal Bora, Mayur B. Chaudhari, Khaled Habib, Waleed S. Mohammed, Joydeep Dutta

  • Optics Letters, Vol. 38, Issue 24, pp. 5438-5441 (December 2013)
  • Wenfeng Sun, Bin Yang, Xinke Wang, Yan Zhang, Robert Donnan

  • Optics Letters, Vol. 39, Issue 1, pp. 17-17 (January 2014)
  • Yinan Zhang, Lei Yuan, Xinwei Lan, Amardeep Kaur, Jie Huang, Hai Xiao

  • Optics Letters, Vol. 39, Issue 2, pp. 331-334 (January 2014)
  • Wenyan Wang, Yanxia Cui, Yingran He, Yuying Hao, Yinyue Lin, Ximin Tian, Ting Ji, Sailing He

  • Optics Letters, Vol. 39, Issue 7, pp. 1827-1830 (April 2014)
  • Shuang Wang, Tiegen Liu, Junfeng Jiang, Kun Liu, Jinde Yin, Zunqi Qin, Shengliang Zou

  • Optics Letters, Vol. 39, Issue 7, pp. 2121-2124 (April 2014)
  • Shen Liu, Yiping Wang, Changrui Liao, Guanjun Wang, Zhengyong Li, Qiao Wang, Jiangtao Zhou, Kaiming Yang, Xiaoyong Zhong, Jing Zhao, Jian Tang

  • Optics Letters, Vol. 39, Issue 8, pp. 2495-2498 (April 2014)
  • John Miller, Matthew Evans

  • Optics Express, Vol. 21, Issue 24, pp. 30114-30125 (December 2013)
  • T. Isogai, J. Miller, P. Kwee, L. Barsotti, M. Evans

  • Optics Express, Vol. 22, Issue 3, pp. 3028-3038 (February 2014)
  • Violeta A. Márquez-Cruz, Juan A. Hernández-Cordero

  • Optics Express, Vol. 22, Issue 3, pp. 3105-3116 (February 2014)
  • Ningbo Huang, Ming Li, Reza Ashrafi, Lixian Wang, Xin Wang, José Azaña, Ninghua Zhu

  • Optics Express, Vol. 22, Issue 5, pp. 5904-5912 (March 2014)
  • Mohammad Amin Tadayon, Martha-Elizabeth Baylor, Shai Ashkenazi

  • Optics Express, Vol. 22, Issue 7, pp. 7883-7897 (April 2014)
  • Jingsong Wei, Rui Wang, Hui Yan, Yongtao Fan

  • Applied Optics, Vol. 52, Issue 34, pp. 8376-8380 (December 2013)
  • A. Börzsönyi, R. Chiche, E. Cormier, R. Flaminio, P. Jojart, C. Michel, K. Osvay, L. Pinard, V. Soskov, A. Variola, F. Zomer

  • Applied Optics, Vol. 53, Issue 3, pp. 469-474 (January 2014)
  • Yi Liu, Shiliang Qu

  • Applied Optics, Vol. 53, Issue 4, pp. 666-673 (February 2014)
  • Brian J. Harding, Thomas W. Gehrels, Jonathan J. Makela

  • Applied Optics, Vol. 53, Issue 7, pp. 1459-1465 (March 2014)
  • G. Vajente

  • Applied Optics, Vol. 53, Issue 11, pp. 2431-2436 (April 2014)
  • Joo-Yun Jung, Jong Yeon Park, Sangwook Han, Aniruddha S. Weling, Dean P. Neikirk

  • Applied Optics, Vol. 53, Issue 12, pp. 2616-2624 (April 2014)
  • Marie-Maude de Denus-Baillargeon, Thomas Schmitt, Stéphane Larouche, Ludvik Martinu

  • Optical Materials Express, Vol. 4, Issue 5, pp. 903-915 (May 2014)
  • Eyal Preter, Rachel A. Katims, Vlada Artel, Chaim N. Sukenik, Denis Donlagic, Avi Zadok
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