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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

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Instrumentation, measurement, and metrology : Interferometry


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  • JOSA A, Vol. 31, Issue 12, pp. 2573-2583 (December 2014)
  • M. J. Collett, G. J. Tee

  • JOSA A, Vol. 31, Issue 12, pp. 2719-2722 (December 2014)
  • Jesús Villa, Gustavo Rodríguez, Ismael de la Rosa, Rumen Ivanov, Tonatiuh Saucedo, Efrén González

  • Optics Letters, Vol. 39, Issue 21, pp. 6162-6165 (November 2014)
  • C. Edwards, B. Bhaduri, B. G. Griffin, L. L. Goddard, G. Popescu

  • Optics Letters, Vol. 39, Issue 22, pp. 6509-6512 (November 2014)
  • C. S. Cheung, J. M. O. Daniel, M. Tokurakawa, W. A. Clarkson, H. Liang

  • Optics Express, Vol. 22, Issue 22, pp. 27309-27320 (November 2014)
  • Dmitrii Yu. Stepanov, Leonardo Corena

  • Optics Express, Vol. 22, Issue 22, pp. 27373-27380 (November 2014)
  • Paul Kumar Upputuri, Li Gong, Haifeng Wang, Manojit Pramanik, Krishna Mohan Nandigana, Mahendra Prasad Kothiyal

  • Optics Express, Vol. 22, Issue 22, pp. 27392-27397 (November 2014)
  • S. C. Zilio

  • Optics Express, Vol. 22, Issue 22, pp. 27669-27674 (November 2014)
  • Yuhang He, Bo Gao, Kaiyuan Xu, Ang Liu, Qiang Li, Liqun Chai

  • Optics Express, Vol. 22, Issue 23, pp. 28154-28162 (November 2014)
  • B. C. Yao, Y. Wu, A. Q. Zhang, Y. J. Rao, Z. G. Wang, Y. Cheng, Y. Gong, W. L. Zhang, Y. F. Chen, K. S. Chiang

  • Optics Express, Vol. 22, Issue 23, pp. 28327-28337 (November 2014)
  • M. T. Hartman, V. Quetschke, D. B. Tanner, D. H. Reitze, G. Mueller

  • Optics Express, Vol. 22, Issue 23, pp. 28353-28362 (November 2014)
  • Jin Hwan Kim, Won Sik Kwon, Hyub Lee, Kyung-Soo Kim, Soohyun Kim

  • Optics Express, Vol. 22, Issue 23, pp. 29152-29160 (November 2014)
  • Nicolas Bourbeau Hébert, Sylvain Boudreau, Jérôme Genest, Jean-Daniel Deschênes

  • Optics Express, Vol. 22, Issue 24, pp. 29787-29798 (December 2014)
  • Holger Knell, Sören Laubach, Gerd Ehret, Peter Lehmann

  • Optics Express, Vol. 22, Issue 24, pp. 30346-30356 (December 2014)
  • Karl Bertling, Julien Perchoux, Thomas Taimre, Robert Malkin, Daniel Robert, Aleksandar D. Rakić, Thierry Bosch

  • Applied Optics, Vol. 53, Issue 31, pp. 7230-7235 (November 2014)
  • Toshiaki Nose, Keisuke Kamata, Toru Takeuchi, Keiju Okano, Naoko Fujita, Hajime Muraguchi, Noriaki Ozaki, Michinori Honma, Ryouta Ito

  • Applied Optics, Vol. 53, Issue 31, pp. 7483-7486 (November 2014)
  • Ke Zhang, Li Tao, Wenkai Cheng, Jianhua Liu, Zhongping Chen

  • Applied Optics, Vol. 53, Issue 32, pp. 7697-7703 (November 2014)
  • Lionel R. Watkins, Matthew J. Collett

  • Applied Optics, Vol. 53, Issue 32, pp. 7724-7728 (November 2014)
  • Ruohui Wang, Xueguang Qiao

  • Applied Optics, Vol. 53, Issue 33, pp. 7903-7915 (November 2014)
  • Sophie Morel, Matthew Dubin, Joe Shiefman, James Burge

  • Applied Optics, Vol. 53, Issue 35, pp. 8175-8181 (December 2014)
  • Türkay Kart, Gülşen Kösoğlu, Heba Yüksel, Mehmet Naci İnci
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