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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

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Instrumentation, measurement, and metrology : Phase measurement


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  • Optics Letters, Vol. 39, Issue 15, pp. 4549-4552 (August 2014)
  • Yujie Lu, Yunhui Liu, Tak Kit Lau

  • Optics Letters, Vol. 39, Issue 15, pp. 4603-4606 (August 2014)
  • Arjan J. H. Meskers, Jo W. Spronck, Robert H. Munnig Schmidt

  • Optics Letters, Vol. 39, Issue 16, pp. 4687-4690 (August 2014)
  • V. Gallet, S. Kahaly, O. Gobert, F. Quéré

  • Optics Letters, Vol. 39, Issue 17, pp. 5030-5033 (September 2014)
  • J. M. Trujillo-Sevilla, L. F. Rodríguez-Ramos, I. Montilla, J. M. Rodríguez-Ramos

  • Optics Letters, Vol. 39, Issue 17, pp. 5054-5057 (September 2014)
  • Rakesh Kumar Singh, Anandraj M. Sharma, Bhargab Das

  • Optics Letters, Vol. 39, Issue 17, pp. 5220-5223 (September 2014)
  • Avner Safrani, Ibrahim Abdulhalim

  • Optics Letters, Vol. 39, Issue 18, pp. 5251-5254 (September 2014)
  • Samuel P. Francis, Timothy T-Y. Lam, Kirk McKenzie, Andrew J. Sutton, Robert L. Ward, David E. McClelland, Daniel A. Shaddock

  • Optics Express, Vol. 22, Issue 15, pp. 18203-18213 (July 2014)
  • Yangjin Kim, Kenichi Hibino, Naohiko Sugita, Mamoru Mitsuishi

  • Optics Express, Vol. 22, Issue 15, pp. 18214-18223 (July 2014)
  • Thomas S. Schwarze, Oliver Gerberding, Felipe Guzmán Cervantes, Gerhard Heinzel, Karsten Danzmann

  • Optics Express, Vol. 22, Issue 15, pp. 18310-18324 (July 2014)
  • Chao Zuo, Qian Chen, Hongru Li, Weijuan Qu, Anand Asundi

  • Optics Express, Vol. 22, Issue 16, pp. 18870-18880 (August 2014)
  • Gregory A. Howland, Daniel J. Lum, John C. Howell

  • Optics Express, Vol. 22, Issue 17, pp. 20185-20192 (August 2014)
  • Noel-Ivan Toto-Arellano, Victor H. Flores-Muñoz, Belen Lopez-Ortiz

  • Optics Express, Vol. 22, Issue 18, pp. 21403-21410 (September 2014)
  • Yanhui Li, Tianlin Yang, Zhiyong Pang, Guiqiang Du, Shumei Song, Shenghao Han

  • Optics Express, Vol. 22, Issue 18, pp. 21679-21689 (September 2014)
  • Kun Li, Brian Robertson, Mike Pivnenko, Yuanbo Deng, Daping Chu, Jiong Zhou, Jun Yao

  • Applied Optics, Vol. 53, Issue 22, pp. 4881-4885 (August 2014)
  • Lyle E. Roberts, Robert L. Ward, Andrew J. Sutton, Roland Fleddermann, Glenn de Vine, Emmanuel A. Malikides, Danielle M. R. Wuchenich, David E. McClelland, Daniel A. Shaddock

  • Applied Optics, Vol. 53, Issue 24, pp. 5283-5289 (August 2014)
  • Wei-Hung Su, Cho-Yo Kuo, Fu-Jen Kao

  • Applied Optics, Vol. 53, Issue 24, pp. 5448-5452 (August 2014)
  • Peng-cheng Hu, Peng Chen, Xue-mei Ding, Jiu-bin Tan

  • Applied Optics, Vol. 53, Issue 24, pp. 5453-5459 (August 2014)
  • Ming Diao, Bengong Hao, Mingguang Shan, Ying Wang, Zhong Zhi, Yabin Zhang

  • Applied Optics, Vol. 53, Issue 27, pp. G33-G43 (September 2014)
  • Chris Edwards, Renjie Zhou, Suk-Won Hwang, Steven J. McKeown, Kaiyuan Wang, Basanta Bhaduri, Raman Ganti, Peter J. Yunker, Arjun G. Yodh, John A. Rogers, Lynford L. Goddard, Gabriel Popescu

  • Applied Optics, Vol. 53, Issue 27, pp. G44-G63 (September 2014)
  • Wolfgang Osten, Ahmad Faridian, Peng Gao, Klaus Körner, Dinesh Naik, Giancarlo Pedrini, Alok Kumar Singh, Mitsuo Takeda, Marc Wilke
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