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Journal of Display Technology

Journal of Display Technology

| A JOINT IEEE/OSA PUBLICATION

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Microscopy : Near-field microscopy


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  • JOSA A, Vol. 31, Issue 4, pp. 802-807 (April 2014)
  • S. V. Alferov, S. N. Khonina, S. V. Karpeev

  • JOSA A, Vol. 31, Issue 7, pp. 1627-1635 (July 2014)
  • Lasse-Petteri Leppänen, Ari T. Friberg, Tero Setälä

  • Optics Letters, Vol. 39, Issue 5, pp. 1157-1160 (March 2014)
  • Angela E. Klein, Carsten Schmidt, Mattes Liebsch, Norik Janunts, Mikhail Dobynde, Andreas Tünnermann, Thomas Pertsch

  • Optics Letters, Vol. 39, Issue 9, pp. 2802-2805 (May 2014)
  • Boris le Feber, Nir Rotenberg, Dries van Oosten, L. Kuipers

  • Optics Letters, Vol. 39, Issue 11, pp. 3308-3311 (June 2014)
  • Anders Pors, Khachatur V. Nerkararyan, Sergey I. Bozhevolnyi

  • Optics Letters, Vol. 39, Issue 12, pp. 3686-3689 (June 2014)
  • Mikko J. Huttunen, Klas Lindfors, Domenico Andriano, Jouni Mäkitalo, Godofredo Bautista, Markus Lippitz, Martti Kauranen

  • Optics Express, Vol. 22, Issue 1, pp. 283-288 (January 2014)
  • C. Triolo, S. Patanè, M. Mazzeo, S. Gambino, G. Gigli, M. Allegrini

  • Optics Express, Vol. 22, Issue 2, pp. 1687-1696 (January 2014)
  • D. E. Tranca, C. Stoichita, R. Hristu, S. G. Stanciu, G. A. Stanciu

  • Optics Express, Vol. 22, Issue 3, pp. 2965-2972 (February 2014)
  • Yan Li, Nan Zhou, Edward C. Kinzel, Xifeng Ren, Xianfan Xu

  • Optics Express, Vol. 22, Issue 4, pp. 4799-4816 (February 2014)
  • Gang Bao, Tao Cui, Peijun Li

  • Optics Express, Vol. 22, Issue 5, pp. 5228-5233 (March 2014)
  • A. H. Rose, B. M. Wirth, R. E. Hatem, A. P. Rashed Ahmed, M. J. Burns, M. J. Naughton, K. Kempa

  • Optics Express, Vol. 22, Issue 8, pp. 10072-10080 (April 2014)
  • Ali El Eter, Nyha M. Hameed, Fadi I. Baida, Roland Salut, Claudine Filiatre, Dusan Nedeljkovic, Elie Atie, Samuel Bole, Thierry Grosjean

  • Optics Express, Vol. 22, Issue 9, pp. 10341-10350 (May 2014)
  • Vladimir A. Zenin, Anders Pors, Zhanghua Han, René L. Eriksen, Valentyn S. Volkov, Sergey I. Bozhevolnyi

  • Optics Express, Vol. 22, Issue 9, pp. 11061-11069 (May 2014)
  • F. Blanchard, K. Sumida, C. Wolpert, M. Tsotsalas, T. Tanaka, A. Doi, S. Kitagawa, D. G. Cooke, S. Furukawa, K. Tanaka

  • Optics Express, Vol. 22, Issue 10, pp. 12189-12199 (May 2014)
  • K. Imura, K. Ueno, H. Misawa, H. Okamoto, D. McArthur, B. Hourahine, F. Papoff

  • Optics Express, Vol. 22, Issue 11, pp. 13308-13313 (June 2014)
  • Sylvain Vedraine, Renjie Hou, Peter R. Norton, François Lagugné-Labarthet

  • Optics Express, Vol. 22, Issue 11, pp. 13744-13754 (June 2014)
  • Daniel Ploss, Arian Kriesch, Hannes Pfeifer, Peter Banzer, Ulf Peschel

  • Optics Express, Vol. 22, Issue 12, pp. 14830-14839 (June 2014)
  • Nurrul Syafawati Binti Humam, Yu Sato, Motoki Takahashi, Shohei Kanazawa, Nobuhiro Tsumori, Philippe Regreny, Michel Gendry, Toshiharu Saiki

  • Optics Express, Vol. 22, Issue 12, pp. 15075-15087 (June 2014)
  • Mathieu Mivelle, Pierre Viktorovitch, Fadi I. Baida, Ali El Eter, Zhihua Xie, Than-Phong Vo, Elie Atie, Geoffrey W. Burr, Dusan Nedeljkovic, Jean-Yves Rauch, Ségolène Callard, Thierry Grosjean

  • Optics Express, Vol. 22, Issue 13, pp. 16645-16659 (June 2014)
  • Jeffrey D’ Archangel, Eric Tucker, Markus B. Raschke, Glenn Boreman
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