Large-aperture focusing of x rays with micropore optics using dry etching of silicon wafers

• Abstract

• Optics Letters, Vol. 37, Issue 5, pp. 779-781 (March 2012)
• Yuichiro Ezoe, Teppei Moriyama, Tomohiro Ogawa, Takuya Kakiuchi, Ikuyuki Mitsuishi, Kazuhisa Mitsuda, Tatsuhiko Aoki, Kohei Morishita, Kazuo Nakajima

Wave-optical theory of nanofocusing x-ray multilayer mirrors

• Abstract

• Optics Letters, Vol. 37, Issue 17, pp. 3705-3707 (September 2012)
• Markus Osterhoff, Christian Morawe, Claudio Ferrero, Jean-Pierre Guigay

Development of a multilayer mirror for high-intensity monochromatic x-ray using lab-based x-ray source

• Abstract

• Optics Letters, Vol. 37, Issue 18, pp. 3777-3779 (September 2012)
• Thanh-hai Nguyen, Seonggeun Song, Jin-Ho Jung, Insu Jeon

Grating-based at-wavelength metrology of hard x-ray reflective optics

• Abstract

• Optics Letters, Vol. 37, Issue 21, pp. 4464-4466 (November 2012)
• Sebastien Berujon, Eric Ziegler

Soft x-ray low-pass filter with a square-pore microchannel plate

• Abstract
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• Optics Letters, Vol. 38, Issue 9, pp. 1509-1511 (May 2013)
• Zhurong Cao, Fengtao Jin, Jianjun Dong, Zhenghua Yang, Xiayu Zhan, Zheng Yuan, Haiying Zhang, Shaoen Jiang, Yongkun Ding

X-ray optics simulation using Gaussian superposition technique

• Abstract
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• Optics Express, Vol. 19, Issue 20, pp. 19050-19060 (September 2011)
• Mourad Idir, Moisés Cywiak, Arquímedes Morales, Mohammed H. Modi

Ellipsometry with randomly varying polarization states

• Abstract
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• Optics Express, Vol. 20, Issue 2, pp. 870-878 (January 2012)
• Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, Fred Bijkerk

Hard-X-ray imaging optics based on four aspherical mirrors with 50 nm resolution

• Abstract
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• Optics Express, Vol. 20, Issue 9, pp. 10310-10319 (April 2012)
• Satoshi Matsuyama, Naotaka Kidani, Hidekazu Mimura, Yasuhisa Sano, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Tetsuya Ishikawa, Kazuto Yamauchi

Spectral properties of La/B - based multilayer mirrors near the boron K absorption edge

• Abstract
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• Optics Express, Vol. 20, Issue 11, pp. 11778-11786 (May 2012)
• Igor A. Makhotkin, Erwin Zoethout, Eric Louis, Andrei M. Yakunin, Stephan Müllender, Fred Bijkerk

Non-null full field X-ray mirror metrology using SCOTS: a reflection deflectometry approach

• Abstract
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• Optics Express, Vol. 20, Issue 11, pp. 12393-12406 (May 2012)
• Peng Su, Yuhao Wang, James H. Burge, Konstantine Kaznatcheev, Mourad Idir

NbC/Si multilayer mirror for next generation EUV light sources

• Abstract
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• Optics Express, Vol. 20, Issue 14, pp. 15114-15120 (July 2012)
• Mohammed H. Modi, S. K. Rai, Mourad Idir, F. Schaefers, G. S. Lodha

Wavefront measurement for a hard-X-ray nanobeam using single-grating interferometry

• Abstract
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• Optics Express, Vol. 20, Issue 22, pp. 24977-24986 (October 2012)
• Satoshi Matsuyama, Hikaru Yokoyama, Ryosuke Fukui, Yoshiki Kohmura, Kenji Tamasaku, Makina Yabashi, Wataru Yashiro, Atsushi Momose, Tetsuya Ishikawa, Kazuto Yamauchi

Correction to article “Ellipsometry with randomly varying polarization states”

• Abstract
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• Optics Express, Vol. 20, Issue 28, pp. 29308-29308 (December 2012)
• Feng Liu, Chris J. Lee, Juequan Chen, Eric Louis, Peter J. M. van der Slot, Klaus J. Boller, Fred Bijkerk

The theoretical analysis of the hard X-ray block-structure supermirror

• Abstract
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• Optics Express, Vol. 21, Issue 7, pp. 8638-8651 (April 2013)
• Youwei Yao, Hideyo Kunieda, Zhanshan Wang

Coherent x-ray zoom condenser lens for diffractive and scanning microscopy

• Abstract
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• Optics Express, Vol. 21, Issue 8, pp. 9267-9276 (April 2013)
• Takashi Kimura, Satoshi Matsuyama, Kazuto Yamauchi, Yoshinori Nishino

X-ray phase imaging with a laboratory source using selective reflection from a mirror

• Abstract
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• Optics Express, Vol. 21, Issue 8, pp. 9308-9314 (April 2013)
• Daniele Pelliccia, David M. Paganin

Quantitative determination of higher harmonic content in the soft x-ray spectra of toroidal grating monochromator using a reflection multilayer

• Abstract

• Applied Optics, Vol. 51, Issue 16, pp. 3552-3557 (June 2012)
• Mohammed H. Modi, R. K. Gupta, Amol Singh, G. S. Lodha

Sputter deposition of PZT piezoelectric films on thin glass substrates for adjustable x-ray optics

• Abstract

• Applied Optics, Vol. 52, Issue 14, pp. 3412-3419 (May 2013)
• Rudeger H. T. Wilke, Raegan L. Johnson-Wilke, Vincenzo Cotroneo, William N. Davis, Paul B. Reid, Daniel A. Schwartz, Susan Trolier-McKinstry

Epoxy replication of hard X-ray supermirrors

• Abstract

• Chinese Optics Letters, Vol. 9, Issue 9, pp. 091601- (September 2011)
• Fangfang Wang, Wenbin Li, Qiushi Huang, Jingtao Zhu, Baozhong Mu, Zhanshan Wang

Asymmetrical diffusion at interfaces of Mg/SiC multilayers

• Abstract
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• Optical Materials Express, Vol. 3, Issue 5, pp. 546-555 (May 2013)
• Haochuan Li, Jingtao Zhu, Zhanshan Wang, Zhuqing Song, Hong Chen