Abstract
We propose a modified inverse regularization algorithm for computing
the 2-D refractive index profiles of integrated-optic waveguides from measured
near-field data. The algorithm involves embedding of a spatial mean filter
to remove impulses and high frequency noises from the near-field intensity
as well as from its second derivative. The proposed filtering scheme is built-in
to the inverse algorithm and does not require extra computation for filtering.
The effectiveness of the proposed method is demonstrated by reconstructing
the Refractive index profile of a single mode lithium niobate channel waveguide
from the propagating mode near-field intensity pattern.
© 2009 IEEE
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