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Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 28,
  • Issue 11,
  • pp. 1714-1719
  • (2010)

Optical Characterization of Bending Efficiency in On-Chip Hollow-Core Bragg Waveguides at $\lambda =\ $1.5$\ \mu$m

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Abstract

We present an experimental demonstration of high bending efficiency $({>}80\hbox{\%})$ in on-chip hollow core of Bragg waveguides. Laser light in the wavelength range 1260–1630 nm is coupled into the hollow core of Bragg waveguides made of alternating silicon and silicon dioxide layers, and the transmission intensity of straight waveguides and waveguides with two bends are compared. Guiding by both types of waveguides is observed over a wide range of $\lambda$ (${\sim} 150$ nm).

© 2010 IEEE

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