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Journal of Lightwave Technology

Journal of Lightwave Technology


  • Vol. 16, Iss. 4 — Apr. 1, 1998
  • pp: 573–

Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors

Olivier Parriaux and G. J. Veldhuis

Journal of Lightwave Technology, Vol. 16, Issue 4, pp. 573- (1998)

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Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface.


Olivier Parriaux and G. J. Veldhuis, "Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors," J. Lightwave Technol. 16, 573- (1998)

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  1. O. Parriaux and P. Dierauer, "Normalized expressions for the optical sensitivity evanescent wave sensors," Opt. Lett., vol. 19, pp. 508-510, 1994.
  2. O. Parriaux, V. A. Sychugov, and A. V. Tishchenko, "Coupling gratings as waveguide functional elements," Pure Appl. Opt., vol. 5, pp. 453-469, 1996.

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