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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 16, Iss. 4 — Apr. 1, 1998
  • pp: 573–

Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors

Olivier Parriaux and G. J. Veldhuis

Journal of Lightwave Technology, Vol. 16, Issue 4, pp. 573- (1998)


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Abstract

Closed-form analytical expressions and normalized charts provide the conditions for the maximum sensitivity of transverse electric (TE) and transverse magnetic (TM) evanescent-wave step-index waveguide sensors. The analysis covers both cases where the measurand is homogeneously distributed in the semi-infinite waveguide cover, and where it is an ultrathin film at the waveguide-cover interface.

[IEEE ]

Citation
Olivier Parriaux and G. J. Veldhuis, "Normalized Analysis for the Sensitivity Optimization of Integrated Optical Evanescent-Wave Sensors," J. Lightwave Technol. 16, 573- (1998)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-16-4-573

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