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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 16, Iss. 7 — Jul. 1, 1998
  • pp: 1308–

Propagation Loss Measurements in Semiconductor Microcavity Ring and Disk Resonators

D. Rafizadeh, J. P. Zhang, R. C. Tiberio, and S. T. Ho

Journal of Lightwave Technology, Vol. 16, Issue 7, pp. 1308- (1998)


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Abstract

We report the measurement of cavity propagation losses in nearly single-mode semiconductor waveguide-coupled ring and disk microcavity optical resonators. Using a novel 10.5-{ {\mu}}m-diameter ring resonator, we measure transverse electric (TE) and transverse magnetic (TM) field intensity losses in 0.35-{ {\mu}}m-wide ring waveguide cavities in the 1.55-{ {\mu}}m-wavelength region. We present the experimental results for nanofabricated AlGaAs/GaAs 10.5-{ {\mu}}m-diameter ring and disk resonators to quantify cavity losses and to show the feasibility of these promising and robust submicron-scale devices.

[IEEE ]

Citation
D. Rafizadeh, J. P. Zhang, R. C. Tiberio, and S. T. Ho, "Propagation Loss Measurements in Semiconductor Microcavity Ring and Disk Resonators," J. Lightwave Technol. 16, 1308- (1998)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-16-7-1308

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