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Journal of Lightwave Technology

Journal of Lightwave Technology


  • Vol. 16, Iss. 7 — Jul. 1, 1998
  • pp: 1343–

A Generalized Approach to Optical Low-Coherence Reflectometry Including Spectral Filtering Effects

Uwe Wiedmann, Philippe Gallion, and Guang-Hua Duan

Journal of Lightwave Technology, Vol. 16, Issue 7, pp. 1343- (1998)

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In the interpretation of optical low-coherence reflectometry measurements, the reflectivity of the device under test is in general supposed to be with a slow dependency on optical wavelength. However, recent research aims at investigating strongly wavelength-dependent devices, such as fiber Bragg gratings and semiconductor lasers. In this paper, a general theory including spectral filtering effects is developed. It appears as a generalization of previously reported results only valid under special conditions.


Uwe Wiedmann, Philippe Gallion, and Guang-Hua Duan, "A Generalized Approach to Optical Low-Coherence Reflectometry Including Spectral Filtering Effects," J. Lightwave Technol. 16, 1343- (1998)

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  1. A. Kohlhaas, C. Fr mchen, and E. Brinkmeyer, "High-resolution OCDR for testing integrated-optical waveguides: Dispersion-corrupted experimental data corrected by a numerical algorithm," J. Lightwave Technol., vol. 9, pp. 1493-1502, Nov. 1991.
  2. U. Wiedmann, P. Gallion, Y. Jaou n, and C. Chabran, "Analysis of distributed feedback lasers using optical low-coherence reflectometry," J. Lightwave Technol., vol. 16, pp. 864-869, May 1998.

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