This paper presents the analysis of a general nonrectangular electrooptic (EO) scanner and compare its performance to a rectangular device. Since the scanning sensitivity of an EO scanner is inversely proportional to its width, high sensitivity requires the device contour to be close to the ray trajectory of a beam propagating through the device. Accordingly, a shaped-optimized scanner is designed so that the beam trajectory at maximum deflection is parallel to the device contour. A beam propagation method (BPM) simulation shows the performance agrees well with the analysis.
Yi Chiu, Jie Zou, Daniel D. Stancil, and T. E. Schlesinger, "Shape-Optimized Electrooptic Beam Scanners: Analysis, Design, and Simulation," J. Lightwave Technol. 17, 108- (1999)