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Optica Publishing Group
  • Journal of Lightwave Technology
  • Vol. 17,
  • Issue 5,
  • pp. 912-
  • (1999)

Bandwidth Enhancement for P-End-Illuminated InP/InGaAs/InP p-i-n Photodiodes by Utilizing Symmetrical Doping Profiles

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Abstract

This paper shows that the bandwidth of p-end-illuminated planar InP/InGaAs/InP heterojunction p-i-n photodiode can be promoted by using a rather symmetrical doping profile that is produced through diffusion depth control. Caused by extra-depleted InP region in the end of p-InP, the device with symmetrical doping profile has additional series capacitance and thus has a smaller total capacitance than conventional asymmetrical doping profile. Such devices with 0.3 m depleted InP cap region, together with 1 m depleted InGaAs absorption region and 0.3 m depleted InP buffer region, having the capacitance as small as those devices with 1.6 m depletion region, while have the carrier transit time as short as those devices with 1.3 m depletion region. Under appropriate bias condition, which is required for getting rid of the heterointerface effects, the symmetrical device as stated with 40 m junction diameter can have a 3 dB bandwidth exceeding 17 GHz without inductance optimization. For device with conventional asymmetrical doping profile, that is, the p-n junction locating at 0.1 m deep in the InGaAs layer, only a bandwidth of about 15 GHz can be obtained. Due to the same thickness of InGaAs absorption layer, both devices have similar responsivity of 0.8 A/W at - 5 V at 1.3 m wavelength. However, the heterointerface exposed in the depletion region results in several detrimental effects in symmetrical devices, such as interface-generation current, which leads to slightly increased dark current, and barrier/traps for hole transport, which lead to inferior photoresponse at low biases.

[IEEE ]

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