Abstract

A new method for an accurate characterization of the ordinary refractive index profile of proton-exchanged waveguides is presented and discussed. The method is based on the measurement of the power coupled into radiation modes of the waveguide as a function of the corresponding effective indexes,and allows the determination of the depth and of the film refractive index of the ordinary profile by a least squares fitting of the experimental points. The depth and the film refractive index have been experimentally obtained with an accuracy of 0.005 m and 0.0001,respectively.

[IEEE ]

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