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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 19, Iss. 12 — Dec. 1, 2001
  • pp: 1938–

Fabrication and Characterization of Narrow-Band Bragg-Reflection Filters in Silicon-on-Insulator Ridge Waveguides

Thomas Edward Murphy, Jeffrey Todd Hastings, and Henry I. Smith

Journal of Lightwave Technology, Vol. 19, Issue 12, pp. 1938- (2001)


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Abstract

We describe the design, fabrication and measurement of an integrated-optical Bragg grating filter, operating at a free-space wavelength of 1543 nm, based upon a silicon-on-insulator (SOI) ridge waveguide. The measured spectral response for a 4-mm long grating has a bandwidth of 15 GHz (0.12 nm), and shows good agreement with theoretical predictions.

[IEEE ]

Citation
Thomas Edward Murphy, Jeffrey Todd Hastings, and Henry I. Smith, "Fabrication and Characterization of Narrow-Band Bragg-Reflection Filters in Silicon-on-Insulator Ridge Waveguides," J. Lightwave Technol. 19, 1938- (2001)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-19-12-1938

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