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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 20, Iss. 10 — Oct. 1, 2002
  • pp: 1805–

System Outage Probability Due to the Combined Effect of PMD and PDL

Ping Lu, Liang Chen, and Xiaoyi Bao

Journal of Lightwave Technology, Vol. 20, Issue 10, pp. 1805- (2002)


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Abstract

The system outage probability induced by polarization mode dispersion (PMD) and polarization dependent loss (PDL) is studied by Monte Carlo simulations using a new waveplate model. The previous waveplate model gives zero PMD and PDL probability densities when PMD and PDL exceed certain values, while our new model does not have such a limitation. It is shown that the system outage probability strongly depends on the interaction of PMD and PDL and the acceptable PMD limit drops significantly with the increase of PDL.

[IEEE ]

Citation
Ping Lu, Liang Chen, and Xiaoyi Bao, "System Outage Probability Due to the Combined Effect of PMD and PDL," J. Lightwave Technol. 20, 1805- (2002)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-20-10-1805

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