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Journal of Lightwave Technology

Journal of Lightwave Technology


  • Vol. 20, Iss. 10 — Oct. 1, 2002
  • pp: 1805–

System Outage Probability Due to the Combined Effect of PMD and PDL

Ping Lu, Liang Chen, and Xiaoyi Bao

Journal of Lightwave Technology, Vol. 20, Issue 10, pp. 1805- (2002)

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The system outage probability induced by polarization mode dispersion (PMD) and polarization dependent loss (PDL) is studied by Monte Carlo simulations using a new waveplate model. The previous waveplate model gives zero PMD and PDL probability densities when PMD and PDL exceed certain values, while our new model does not have such a limitation. It is shown that the system outage probability strongly depends on the interaction of PMD and PDL and the acceptable PMD limit drops significantly with the increase of PDL.


Ping Lu, Liang Chen, and Xiaoyi Bao, "System Outage Probability Due to the Combined Effect of PMD and PDL," J. Lightwave Technol. 20, 1805- (2002)

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