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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 20, Iss. 3 — Mar. 1, 2002
  • pp: 519–

Detailed Analysis of the Intracavity Phenomena Inside a Cylindrical Microresonator

D. J. W. Klunder, M. L. M. Balistreri, F. C. Blom, H. J. W. M. Hoekstra, A. Driessen, L. Kuipers, and N. F. van Hulst

Journal of Lightwave Technology, Vol. 20, Issue 3, pp. 519- (2002)


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Abstract

Based on a rigorous analysis of the intensity distribution inside a cylindrical microresonator (MR), a detailed description of the wavelength and spatial dependence of the intracavity intensity is given. The theory is in accordance with photon scanning tunneling microscopy (PSTM) of an integrated optics MR. Good agreement between the theory and the PSTM measurements is found.

[IEEE ]

Citation
D. J. W. Klunder, M. L. M. Balistreri, F. C. Blom, H. J. W. M. Hoekstra, A. Driessen, L. Kuipers, and N. F. van Hulst, "Detailed Analysis of the Intracavity Phenomena Inside a Cylindrical Microresonator," J. Lightwave Technol. 20, 519- (2002)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-20-3-519


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