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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 21, Iss. 10 — Oct. 1, 2003
  • pp: 2276–

Single-Crystal Sapphire Fiber-Based Strain Sensor for High-Temperature Applications

Hai Xiao, Jiangdong Deng, Gary Pickrell, Russell G. May, and Anbo Wang

Journal of Lightwave Technology, Vol. 21, Issue 10, pp. 2276- (2003)


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Abstract

Single-crystal sapphire fibers have a very high melting point (up to 2050°C), which renders them a very good candidate for the sensing applications at a very high temperature. We present in this paper the recent work of developing single-crystal sapphire fiber extrinsic Fabry-Pérot interferometric strain sensors based on the whitelight interferometric spectrum demodulation technique. Prototype sapphire strain sensors were fabricated and tested at high temperatures up to 1004°C . The preliminary experimental results indicate that the sensors are promising to be used under high-temperature environments for making strain measurements with the strain measurement resolution of 0.2-µ strain.

© 2003 IEEE

Citation
Hai Xiao, Jiangdong Deng, Gary Pickrell, Russell G. May, and Anbo Wang, "Single-Crystal Sapphire Fiber-Based Strain Sensor for High-Temperature Applications," J. Lightwave Technol. 21, 2276- (2003)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-21-10-2276

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