Abstract
This paper presents our latest studies on high-speed electrooptic modulator characterization using the optical spectrum analysis method. Several new characterization techniques are theoretically analyzed and experimentally demonstrated for the measurement of critical device parameters at very high modulation frequencies. Applying this method in our wide-band electrooptic (EO) modulator characterization experiment, we have successfully measured halfwave voltages, frequency responses, and the chirp parameter at frequencies over 10 GHz for several typical high-speed LiNbO3 modulators. Our experiment showed that the optical spectrum analysis provides an accurate and convenient platform for ultra-high-speed EO modulator characterization.
© 2003 IEEE
PDF Article
More Like This
Cited By
You do not have subscription access to this journal. Cited by links are available to subscribers only. You may subscribe either as an Optica member, or as an authorized user of your institution.
Contact your librarian or system administrator
or
Login to access Optica Member Subscription