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Journal of Lightwave Technology

Journal of Lightwave Technology


  • Vol. 21, Iss. 10 — Oct. 1, 2003
  • pp: 2358–

High-Speed Electrooptic Modulator Characterization Using Optical Spectrum Analysis

Yongqiang Shi, Lianshan Yan, and Alan Eli Willner

Journal of Lightwave Technology, Vol. 21, Issue 10, pp. 2358- (2003)

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This paper presents our latest studies on high-speed electrooptic modulator characterization using the optical spectrum analysis method. Several new characterization techniques are theoretically analyzed and experimentally demonstrated for the measurement of critical device parameters at very high modulation frequencies. Applying this method in our wide-band electrooptic (EO) modulator characterization experiment, we have successfully measured halfwave voltages, frequency responses, and the chirp parameter at frequencies over 10 GHz for several typical high-speed LiNbO3 modulators. Our experiment showed that the optical spectrum analysis provides an accurate and convenient platform for ultra-high-speed EO modulator characterization.

© 2003 IEEE

Yongqiang Shi, Lianshan Yan, and Alan Eli Willner, "High-Speed Electrooptic Modulator Characterization Using Optical Spectrum Analysis," J. Lightwave Technol. 21, 2358- (2003)

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