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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 22, Iss. 9 — Sep. 1, 2004
  • pp: 2064–

Direct Current to 34.1-Gb/s,19-Gb/s/cm3 Low-Jitter Parallel Optical Interconnecting Module for High-Speed Memory Test Systems

Toshiyuki Okayasu, Daisuke Watanabe, Atsushi Ono, Masashi Shibata, Yusuke Hayase, Takehiro Shirai, Tomotaka Inoue, Kenji Ueno, Fumiki Hosoi, and Tsutomu Akiyama

Journal of Lightwave Technology, Vol. 22, Issue 9, pp. 2064- (2004)


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Abstract

A protocol-free parallel optical interconnecting module is introduced as a solution to solve memory test system transmission bottlenecks. The optical transmission system flexibly suited for a memory test system is reviewed and discussed. A parallel optical module capable of transmitting from dc to 34.1Gb/s (4.267 Gb/s × 8 ch) has been developed. A data transmission throughput density per unit volume of 19 Gb/s/cm3 is achieved. A random jitter of less than 3-ps root-mean-square is also achieved. Furthermore, high-density optical connector,high-density optical fiber cable, fiber guides, and cable management/reinforcement members suited for mechanical requirements of the memory test system have been developed.

© 2004 IEEE

Citation
Toshiyuki Okayasu, Daisuke Watanabe, Atsushi Ono, Masashi Shibata, Yusuke Hayase, Takehiro Shirai, Tomotaka Inoue, Kenji Ueno, Fumiki Hosoi, and Tsutomu Akiyama, "Direct Current to 34.1-Gb/s,19-Gb/s/cm3 Low-Jitter Parallel Optical Interconnecting Module for High-Speed Memory Test Systems," J. Lightwave Technol. 22, 2064- (2004)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-22-9-2064

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