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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 23, Iss. 3 — Mar. 1, 2005
  • pp: 1295–

Calculation of Losses in Micro-Ring Resonators With Arbitrary Refractive Index or Shape Profile and Its Applications

Payam Rabiei

Journal of Lightwave Technology, Vol. 23, Issue 3, pp. 1295- (2005)


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Abstract

A perturbative approach is discussed for the calculation of the radiation and scattering losses in cylindrical microresonators with arbitrary refractive index or shape profile. A new method for inducing losses in the cavity using the electrooptic effect with periodic modulation of the refractive index is introduced. The perturbative method is used for the calculation of the losses due to periodic modulation of the refractive index. The applications of this approach for the calculation of scattering losses due to surface roughness of microresonators and scattering due to deviation from ideal cylindrical shape are discussed.

© 2005 IEEE

Citation
Payam Rabiei, "Calculation of Losses in Micro-Ring Resonators With Arbitrary Refractive Index or Shape Profile and Its Applications," J. Lightwave Technol. 23, 1295- (2005)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-23-3-1295


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