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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 24, Iss. 1 — Jan. 1, 2006
  • pp: 38–

Fabrication and Characterization of an InGaAsp/InP Active Waveguide Optical Isolator With 14.7 dB/mm TE Mode Nonreciprocal Attenuation

Hiromasa Shimizu and Yoshiaki Nakano

Journal of Lightwave Technology, Vol. 24, Issue 1, pp. 38- (2006)


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Abstract

The authors have fabricated transverse electric (TE) mode InGaAsP/InP active waveguide optical isolators based on the nonreciprocal loss shift and demonstrated improved TE mode isolation ratio of 14.7 dB/mm with reduced insertion loss at a wavelength of 1550 nm for monolithically integrable optical isolators. The wavelength dependence of the isolation ratio and the propagation loss were also measured. An isolation ratio greater than 10 dB/mm was realized over the entire wavelength range of 1530-1560 nm. These results lead to the monolithic integration of semiconductor waveguide optical isolators with edge-emitting semiconductor lasers and highly functional photonic integrated circuits with many cascaded optical devices.

© 2006 IEEE

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Citation
Hiromasa Shimizu and Yoshiaki Nakano, "Fabrication and Characterization of an InGaAsp/InP Active Waveguide Optical Isolator With 14.7 dB/mm TE Mode Nonreciprocal Attenuation," J. Lightwave Technol. 24, 38- (2006)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-24-1-38

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