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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 24, Iss. 11 — Nov. 1, 2006
  • pp: 4006–4012

Automatic Maximum–Minimum Search Method for Accurate PDL and DOP Characterization

Yongqiang Shi, Lianshan Yan, and X. Steve Yao

Journal of Lightwave Technology, Vol. 24, Issue 11, pp. 4006-4012 (2006)


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Abstract

A fully automatic deterministic maximum–minimum search method for fast accurate polarization-dependent loss (PDL) and degree of polarization (DOP) characterization is described. It is shown theoretically, based on a three-dimensional (3-D) surface model, that the method can unambiguously determine PDL and DOP values. Because it measures PDL and DOP values according to their definitions and without the need for scanning over a large number of polarization states or engaging in extensive intermediate calculations, this method provides the attractive features of high speed, wide measurement range, wavelength insensitivity, and calibration-free operation. The new PDL/DOP characterization method was experimentally demonstrated in a prototype instrument using an in-line polarization controller with ultralow activation loss and PDL.

© 2006 IEEE

Citation
Yongqiang Shi, Lianshan Yan, and X. Steve Yao, "Automatic Maximum–Minimum Search Method for Accurate PDL and DOP Characterization," J. Lightwave Technol. 24, 4006-4012 (2006)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-24-11-4006

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