OSA's Digital Library

Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 25, Iss. 7 — Jul. 1, 2007
  • pp: 1811–1818

High-Resolution Measurement of Resonant Wave Patterns by Perturbing the Evanescent Field Using a Nanosized Probe in a Transmission Scanning Near-Field Optical Microscopy Configuration

Wico C. L. Hopman, Remco Stoffer, and René M. de Ridder

Journal of Lightwave Technology, Vol. 25, Issue 7, pp. 1811-1818 (2007)


View Full Text Article

Acrobat PDF (1297 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations
  • Export Citation/Save Click for help

Abstract

In order to model transmission scanning near-field optical microscopy (T-SNOM) experiments, we study the interaction between a nanosized atomic-force-microscopy-type probe and the optical field in a microcavity (MC) at or near resonance. Using a 2-D cross-sectional model of an experimentally studied photonic crystal MC, we have simulated the T-SNOM method by scanning a probe over the surface while monitoring the transmitted and reflected power. The simulations were performed for two probe materials: silicon and silicon nitride. From the probe-induced change in the transmission and reflection spectra, a wavelength shift was extracted. A shift almost proportional to the local field intensity was found if the resonator was excited just below a resonance wavelength. However, at the spots of highest interaction, we observed that besides the desired resonance wavelength shift, there was an increase in scattering. Furthermore, by moving the probe at such a spot in the vertical direction to a height of approximately 0.5 μm, a 5% increase in transmission can be established because the antiresonant condition is satisfied. Finally, a 2-D top view simulation is presented of the experimentally studied T-SNOM method, which shows a remarkably good correspondence in intensity profile, except for the exact location of the high-interaction spots.

© 2007 IEEE

Citation
Wico C. L. Hopman, Remco Stoffer, and René M. de Ridder, "High-Resolution Measurement of Resonant Wave Patterns by Perturbing the Evanescent Field Using a Nanosized Probe in a Transmission Scanning Near-Field Optical Microscopy Configuration," J. Lightwave Technol. 25, 1811-1818 (2007)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-25-7-1811


Sort:  Year  |  Journal  |  Reset

References

  1. L. Novotny, S. J. Stranick, "Near-field optical microscopy and spectroscopy with pointed probes," Annu. Rev. Phys. Chem. 57, 303-331 (2006).
  2. S. F. Wu, "Review of near-field optical microscopy," Front. Phys. China 1, 263-274 (2006).
  3. M. L. M. Balistreri, J. P. Korterik, G. J. Veldhuis, L. Kuipers, N. F. Van Hulst, "Quantitative photon tunneling and shear-force microscopy of planar waveguide splitters and mixers ," J. Appl. Phys. 89, 3307-3314 (2001).
  4. R. J. P. Engelen, T. J. Karle, H. Gersen, "Local probing of Bloch mode dispersion in a photonic crystal waveguide," Opt. Express 13, 4457-4464 (2005).
  5. D. J. W. Klunder, M. L. M. Balistreri, F. C. Blom, "Detailed analysis of the intracavity phenomena inside a cylindrical microresonator," J. Lightw. Technol. 20, 519-529 (2002).
  6. H. Gersen, J. P. Korterik, N. F. van Hulst, L. Kuipers, "Tracking ultrashort pulses through dispersive media: Experiment and theory," Phys. Rev. E, Stat. Phys. Plasmas Fluids Relat. Interdiscip. Top. 68, 026 604/1-026 604/10 (2003).
  7. I. Stefanon, S. Blaize, A. Bruyant, "Heterodyne detection of guided waves using a scattering-type scanning near-field optical microscope," Opt. Express 13, 5553-5564 (2005).
  8. W. C. L. Hopman, K. O. Van Der Werf, A. J. F. Hollink, "Nano-mechanical tuning and imaging of a photonic crystal micro-cavity resonance," Opt. Express 14, 8745-8752 (2006).
  9. J. T. Robinson, S. F. Preble, M. Lipson, "Imaging highly confined modes in sub-micron scale silicon waveguides using transmission-based near-field scanning optical microscopy," Opt. Express 14, 10 588-10 595 (2006).
  10. I. Märki, M. Salt, H. P. Herzig, "Tuning the resonance of a photonic crystal microcavity with an AFM probe," Opt. Express 14, 2969-2978 (2006).
  11. M. Hammer, R. Stoffer, "PSTM/NSOM modeling by 2-D quadridirectional eigenmode expansion," J. Lightw. Technol. 23, 1956-1966 (2005).
  12. W. Bogaerts, "Nanophotonic waveguides in silicon-on-insulator fabricated with CMOS technology," J. Lightw. Technol. 23, 401-412 (2005).
  13. M. Hammer, "Quadridirectional eigenmode expansion scheme for 2-D modeling of wave propagation in integrated optics," Opt. Commun. 235, 285-303 (2004).
  14. E. Flück, M. Hammer, A. M. Otter, "Amplitude and phase evolution of optical fields inside periodic photonic structures ," J. Lightw. Technol. 21, 1384-1393 (2003).
  15. H. Kogelnik, Guided-Wave Optoelectronics (Springer-Verlag, 1990) pp. 31.
  16. H. P. Uranus, H. J. W. M. Hoekstra, E. Van Groesen, "Considerations on material composition for low-loss hollow-core integrated optical waveguides ," Opt. Commun. 260, 577-582 (2006).
  17. B. Ben Bakir, C. Seassal, X. Letartre, "Room-temperature InAs/InP quantum dots laser operation based on heterogeneous ‘2.5 D’ photonic crystal," Opt. Express 14, 9269-9276 (2006).
  18. A. F. Koenderink, M. Kafesaki, B. C. Buchler, V. Sandoghdar, "Controlling the resonance of a photonic crystal microcavity by a near-field probe," Phys. Rev. Lett. 95, 153 904-1-153 904-4 (2005).

Cited By

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited