Abstract
This paper proposes a novel optical sampling technique for monitoring
ultrafast signal waveforms. The dual-channel sampling system, which employs
two parallel interferometers offset by a slight relative delay, enables us
to observe not only intensity but also phase (frequency) modulation without
any restriction as regards signal coherence. The proposed method, based on
linear interaction with local short-pulses, also allows the measurement of
ultrafast signals without any electrical bandwidth limitation. The performance
advantages of the proposed method are clarified through experiments, in which
we successfully observe the intensity and frequency modulation of 10-Gbit/s
gain-switched laser diode pulses and 160-Gbit/s optical time-division multiplexing
signals, whose coherence time is much shorter than the sampling period.
© 2009 IEEE
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