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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 27, Iss. 21 — Nov. 1, 2009
  • pp: 4841–4847

On the Modeling of Losses in Short Length Photonic Crystal Waveguides

Martin J. Cryan

Journal of Lightwave Technology, Vol. 27, Issue 21, pp. 4841-4847 (2009)


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Abstract

The 3-D finite difference time domain (FDTD) cut-back method is used to study losses in nondisordered photonic crystal silicon membrane waveguides. Losses above the light-line have been shown to be in good agreement with other methods. Below the light-line, however, FDTD is predicting a rapid increase in losses. This paper studies the possible causes for this effect, including meshing effects, back reflections, and finite thickness sidewalls. It is found that since below the light-line the group index becomes very high and the loss becomes very low, strong Fabry–Perot oscillations dominate the cut-back results. The paper also discusses the impact of operating near to the cut-off wavelength of the photonic crystal waveguide Bloch mode and the implications this has for loss calculation.

© 2009 IEEE

Citation
Martin J. Cryan, "On the Modeling of Losses in Short Length Photonic Crystal Waveguides," J. Lightwave Technol. 27, 4841-4847 (2009)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-27-21-4841


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