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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 27, Iss. 24 — Dec. 15, 2009
  • pp: 5775–5782

Effect of the Wetting Layer on the Output Power of a Double Tunneling-Injection Quantum-Dot Laser

Dae-Seob Han and Levon V. Asryan

Journal of Lightwave Technology, Vol. 27, Issue 24, pp. 5775-5782 (2009)


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Abstract

To suppress bipolar population and hence electron–hole recombination outside quantum dots (QDs), tunneling-injection of electrons and holes into QDs from two separate quantum wells was proposed earlier. Close-to-ideal operating characteristics were predicted for such a double tunneling-injection (DTI) laser. In the Stranski–Krastanow growth mode, a two-dimensional wetting layer (WL) is initially grown followed by the formation of QDs. Due to thermal escape of carriers from QDs, there will be bipolar population and hence electron–hole recombination in the WL, even in a DTI structure. In this work, the light–current characteristic (LCC) of a DTI QD laser is studied in the presence of the WL. Since the opposite sides of a DTI structure are only connected by the current paths through QDs and the WL is located in the n-side of the structure, the only source of holes for the WL is provided by QDs. It is shown that, due to the zero-dimensional nature of QDs, the rate of the hole supply to the WL remains limited with increasing injection current. For this reason, as in the other parts of the structure outside QDs (quantum wells and optical confinement layer), the parasitic electron–hole recombination remains restricted in the WL. As a result, even in the presence of the WL, the LCC of a DTI QD laser becomes increasingly linear at high injection currents, which is a further demonstration of the potential of such a laser for high-power operation.

© 2009 IEEE

Citation
Dae-Seob Han and Levon V. Asryan, "Effect of the Wetting Layer on the Output Power of a Double Tunneling-Injection Quantum-Dot Laser," J. Lightwave Technol. 27, 5775-5782 (2009)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-27-24-5775

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