Testing of integrated (guided-wave) optical component that uses cleaved facets for input/output coupling has to deal with spurious Fabry-Pérot cavity effects that can interfere heavily with observation and measurement of the behavior of the device. This paper demonstrates a technique that takes advantage of such interference for the reconstruction of the complete characteristics of a generic component. By studying a theoretical model of the system, a post-process computational tool is developed and verified through numerical testing. Starting from a single transmittance data set, the amplitude and phase of the transmission and reflection coefficients are reconstructed with considerable accuracy. Initial experimental testing demonstrates consistency in reconstructing the behavior of a real device.
© 2009 IEEE
Marco Gnan, Gaetano Bellanca, and Richard M. De La Rue, "Post-Process Removal of Spurious Fabry-Pérot Oscillations Caused by Cleaved Waveguide-Ends," J. Lightwave Technol. 27, 500-510 (2009)