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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 28, Iss. 19 — Oct. 1, 2010
  • pp: 2836–2842

SiON Integrated Optics Elliptic Couplers for Fizeau-Based Optical Coherence Tomography

Van Duc Nguyen, Nur Ismail, Fei Sun, Kerstin Wörhoff, Ton G. van Leeuwen, and Jeroen Kalkman

Journal of Lightwave Technology, Vol. 28, Issue 19, pp. 2836-2842 (2010)


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Abstract

Integrated optics potentially can offer significant cost reductions and new applications to Optical Coherence Tomography (OCT). We design, fabricate, and characterize Silicon oxynitride (SiON) elliptic couplers, which can be used to focus light from a chip into the off-chip environment. Fizeau-based OCT measurements are performed with elliptic couplers and a moveable mirror. The optical fields at the output of the elliptic coupler are simulated and measured. Good agreement is observed between the measured OCT signal as a function of depth and calculations based on the optical field at the end of the elliptic coupler.

© 2010 IEEE

Citation
Van Duc Nguyen, Nur Ismail, Fei Sun, Kerstin Wörhoff, Ton G. van Leeuwen, and Jeroen Kalkman, "SiON Integrated Optics Elliptic Couplers for Fizeau-Based Optical Coherence Tomography," J. Lightwave Technol. 28, 2836-2842 (2010)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-28-19-2836

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