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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 28, Iss. 21 — Nov. 1, 2010
  • pp: 3176–3183

Photonic Chip-Based Simultaneous Multi-Impairment Monitoring for Phase-Modulated Optical Signals

Trung D. Vo, Jochen Schröder, Mark D. Pelusi, Stephen J. Madden, Duk-Yong Choi, Douglas A. P. Bulla, Barry Luther-Davies, and Benjamin J. Eggleton

Journal of Lightwave Technology, Vol. 28, Issue 21, pp. 3176-3183 (2010)


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Abstract

We report the first experimental demonstration of simultaneous multi-impairment monitoring of phase-modulated 40 Gbit/s nonreturn to zero differential phase-shift keying (NRZ-DPSK) and 640 Gbit/s return-to-zero (RZ)-DPSK optical signals. Our approach exploits the femtosecond response time of the Kerr nonlinearity in a centimeter-scale, highly nonlinear, dispersion engineered chalcogenide planar waveguide to perform THz bandwidth RF spectrum analysis. The features observed on the radio-frequency (RF) spectrum are directly utilized to perform simultaneous group velocity dispersion and in-band optical signal-to-noise ratio (SNR) monitoring. We also numerically investigate the measurement accuracy of this monitoring technique, highlighting the advantages, and suitability of the chalcogenide rib waveguide.

© 2010 IEEE

Citation
Trung D. Vo, Jochen Schröder, Mark D. Pelusi, Stephen J. Madden, Duk-Yong Choi, Douglas A. P. Bulla, Barry Luther-Davies, and Benjamin J. Eggleton, "Photonic Chip-Based Simultaneous Multi-Impairment Monitoring for Phase-Modulated Optical Signals," J. Lightwave Technol. 28, 3176-3183 (2010)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-28-21-3176

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