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Journal of Lightwave Technology

Journal of Lightwave Technology

| A JOINT IEEE/OSA PUBLICATION

  • Vol. 28, Iss. 5 — Mar. 1, 2010
  • pp: 816–821

Time-Frequency Analysis for an Efficient Detection and Localization of Side-Coupled Cavities in Real Photonic Crystals

Yaneck Gottesman, Sylvain Combrié, Alfredo DeRossi, Anne Talneau, Philippe Hamel, Alberto Parini, Renaud Gabet, Yves Jaouen, Badr-Eddine Benkelfat, and Elchuri V. K. Rao

Journal of Lightwave Technology, Vol. 28, Issue 5, pp. 816-821 (2010)


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Abstract

We propose and demonstrate here the high efficiency of concurrent time and frequency analysis to detect and unambiguously identify the coupled cavities in real photonic crystals containing imperfections and/or process-induced disorder. This procedure when applied to reflectograms recorded using phase-sensitive optical low-coherence reflectometry allows a straightforward and complete assessment of cavities (spectral and spatial localization in addition to photon lifetime) over a wide spectral range. Considering such a reflectogram (recorded in ${\sim} {\hbox {2}}$ s), we show that this procedure greatly eases the evaluation of cavities under guiding conditions in real photonic crystals by discriminating their signature from the in-plane scattering induced by disorder.

© 2010 IEEE

Citation
Yaneck Gottesman, Sylvain Combrié, Alfredo DeRossi, Anne Talneau, Philippe Hamel, Alberto Parini, Renaud Gabet, Yves Jaouen, Badr-Eddine Benkelfat, and Elchuri V. K. Rao, "Time-Frequency Analysis for an Efficient Detection and Localization of Side-Coupled Cavities in Real Photonic Crystals," J. Lightwave Technol. 28, 816-821 (2010)
http://www.opticsinfobase.org/jlt/abstract.cfm?URI=jlt-28-5-816


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