Abstract

Passive components for high-speed dense wavelength-division-multiplexing (DWDM) optical networks must be characterized precisely for both loss and dispersion properties: spectral loss, polarization-dependent loss (PDL), group delay (GD), and differential GD (DGD). The ability to test all parameters will be essential in the development and manufacture of passive optical devices and modules such as fiber gratings, arrayed waveguide gratings, or add–drop modules, particularly for 40-Gbit/s networks. New techniques such as swept homodyne interferometry are currently developed for full characterization of modern optical devices. Here we review the latest development in optical component testing for all-loss and all-parameter tests.

© 2002 Optical Society of America

Polarization mode dispersion measurement based on continuous polarization modulation

Bogdan Szafraniec, Rüdiger Mästle, and Douglas M. Baney
Appl. Opt. 47(8) 1109-1116 (2008)

Recent Developments in Infrared Technology

Stanley S. Ballard and William L. Wolfe
Appl. Opt. 1(5) 547-557 (1962)

Development and testing of a holographic projection system

Wu Jiang, David L. Shealy, and Kenneth M. Baker
Appl. Opt. 35(30) 5994-5998 (1996)

Recent developments in profiling optical surfaces

Jean M. Bennett, Virgil Elings, and Kevin Kjoller
Appl. Opt. 32(19) 3442-3447 (1993)

Recent Developments in Photographic Optics in Japan

Teruji Ose
Appl. Opt. 3(7) 793-798 (1964)