Nondestructive Interferometric Thickness Measurement of Thin Transparent Films
JOSA, Vol. 48, Issue 4, pp. 275-275 (1958)
http://dx.doi.org/10.1364/JOSA.48.000275
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Abstract
Citation
ROGER L. SAUER, "Nondestructive Interferometric Thickness Measurement of Thin Transparent Films," J. Opt. Soc. Am. 48, 275-275 (1958)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-48-4-275
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