Vacuum Ultraviolet Wavelength Standards and Improved Energy Levels in the First Spectrum of Silicon
JOSA, Vol. 57, Issue 3, pp. 336-340 (1967)
http://dx.doi.org/10.1364/JOSA.57.000336
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Abstract
Vacuum ultraviolet Si I wavelengths have been recalculated using all available low-pressure-source data. One hundred calculated and forty-one measured wavelengths, all with uncertainties less than 0.002 Å, should be useful as wavelength standards in the region 1560 to 2000 Å. Seventy-seven of the proposed standards were originally calculated by Radziemski and Andrew [J. Opt. Soc. Am. 55, 474 (1965)]; although the two sets of wavelength values agree to within their uncertainties, the new set has a greater internal consistency. Included also is a complete list of low-pressure-source levels for Si I, which contains new values for 30 odd levels previously determined exclusively from relatively high-pressure (450–740 torr) arc data.
Citation
LEON J. RADZIEMSKI JR., KENNETH L. ANDREW, VICTOR KAUFMAN, and ULF LITZÉN, "Vacuum Ultraviolet Wavelength Standards and Improved Energy Levels in the First Spectrum of Silicon," J. Opt. Soc. Am. 57, 336-340 (1967)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-57-3-336
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