Abstract

The descriptions of diffraction by pure reflection gratings (fringes parallel to surfaces) and by reflection gratings with slanted fringes are clarified. The rigorous coupled-wave analysis, the chain-matrix analysis, and the new method presented by Zylberberg and Marom [ J. Opt. Soc. Am. 73, 392 ( 1983)] are compared and their regions of applicability determined. Zylberberg and Marom refer to their method as a coupled-wave analysis, a description that is inconsistent with previous use of this terminology.

© 1983 Optical Society of America

Rigorous coupled-wave analysis of grating diffraction— E-mode polarization and losses

M. G. Moharam and T. K. Gaylord
J. Opt. Soc. Am. 73(4) 451-455 (1983)

Rigorous coupled-wave analysis of pure reflection gratings

Zvi Zylberberg and Emanuel Marom
J. Opt. Soc. Am. 73(3) 392-398 (1983)

Three-dimensional vector coupled-wave analysis of planar-grating diffraction

M. G. Moharam and T. K. Gaylord
J. Opt. Soc. Am. 73(9) 1105-1112 (1983)

Chain-matrix analysis of arbitrary-thickness dielectric reflection gratings

M. G. Moharam and T. K. Gaylord
J. Opt. Soc. Am. 72(2) 187-190 (1982)

Analysis of anisotropic dielectric gratings

Katsu Rokushima and Jiro Yamakita
J. Opt. Soc. Am. 73(7) 901-908 (1983)