OSA's Digital Library

Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 73, Iss. 4 — Apr. 1, 1983
  • pp: 495–497

Near-infrared refractive index of bismuth germanium oxide (Bi12GeO20)

E. Burattini, G. Cappuccio, M. Grandolfo, P. Vecchia, and Sh. M. Efendiev  »View Author Affiliations


JOSA, Vol. 73, Issue 4, pp. 495-497 (1983)
http://dx.doi.org/10.1364/JOSA.73.000495


View Full Text Article

Acrobat PDF (384 KB)





Browse Journals / Lookup Meetings

Browse by Journal and Year


   


Lookup Conference Papers

Close Browse Journals / Lookup Meetings

Article Tools

Share
Citations

Abstract

The dispersion of the refractive index of Bi12GeO20 in the range 1.2–5.0 µm at room temperature has been obtained. Data have been analyzed in terms of Ketteler, Sellmeier–Drude, Lorentz–Lorenz, and Herzberger dispersion formulas. It is found that a Herzberger formula completely describes data on n(λ) up to the visible region.

© 1983 Optical Society of America

Citation
E. Burattini, G. Cappuccio, M. Grandolfo, P. Vecchia, and Sh. M. Efendiev, "Near-infrared refractive index of bismuth germanium oxide (Bi12GeO20)," J. Opt. Soc. Am. 73, 495-497 (1983)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-73-4-495


Sort:  Author  |  Year  |  Journal  |  Reset

References

  1. S. C. Abrahams, P. B. Jamieson, and J. L. Bernstein, "Crystal structure of piezoelectric bismuth germanium oxide Bi12GeO20," J. Chem. Phys. 47, 4034–4041 (1967).
  2. M. Peltier and F. Micheron, "Volume hologram recording and charge transfer process in Bi12GeO20 and Bi12GeO20," J. Appl. Phys. 48, 3683–3690 (1977).
  3. S. G. Lipson and P. Nisenson, "Imaging characteristics of the Itek PROM," Appl. Opt. 13, 2052–2060 (1974).
  4. D. W. Parker, R. G. Pratt, and R. Stevens, "A television IF acoustic surface wave filter on bismuth silicon oxide," Proc. IEEE 64, 677–681 (1976).
  5. R. E. Aldrich, S. L. Hou, and M. L. Harvill, "Electrical and optical properties of Bi12GeO20," J. Appl. Phys. 42, 493–494 (1971).
  6. G. Cappuccio, A. D'Amico, S. D'Angelo, and C. Ranghiasci, "Photometric linearity test for infrared spectrophotometers by means of a rotating sector disk attenuator," Appl. Opt. 21, 3619–3622 (1982).
  7. G. Cappuccio and S. D'Angelo, "Accessory for specular reflectance measurements with double beam spectrophotometers," J. Phys. E 11, 298–299 (1978).
  8. D. D. Sell, H. C. Casey, Jr., and K. W. Wecht, "Concentration dependence of the refractive index for n- and p-type GaAs between 1.2 and 1.8 eV," J. Appl. Phys. 45, 2650–2657 (1974).
  9. F. Oswald and R. Schade, "On the determination of the optical constants of semiconductors of type AIIIBv in the infrared," Z. Naturforsch. 9a, 611–617 (1954).
  10. B. Paul, "Nomogram for calculation of optical constants from transmittance and reflectance measurements," Infrared Phys. 5, 161–173 (1965).
  11. K. Vedam and P. Hennessey, "Piezo- and thermo-optical properties of Bi12GeO20, II. Refractive index," J. Opt. Soc. Am. 65, 442–445 (1975).
  12. P. Hennessey and K. Vedam, "Piezo- and thermo-optical properties of Bi12GeO20-III. The dispersion theories and models," J. Opt. Soc. Am. 69, 352–356 (1979).
  13. M. Herzberger, "Colour correction in optical systems and a new dispersion formula," Opt. Acta 6, 197–215 (1959).

Cited By

Alert me when this paper is cited

OSA is able to provide readers links to articles that cite this paper by participating in CrossRef's Cited-By Linking service. CrossRef includes content from more than 3000 publishers and societies. In addition to listing OSA journal articles that cite this paper, citing articles from other participating publishers will also be listed.

« Previous Article  |  Next Article »

OSA is a member of CrossRef.

CrossCheck Deposited