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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 37, Iss. 10 — Oct. 1, 1947
  • pp: 873–876

Coating Thickness Measurement by Interferometry

M. F. BECHTOLD  »View Author Affiliations


JOSA, Vol. 37, Issue 10, pp. 873-876 (1947)
http://dx.doi.org/10.1364/JOSA.37.000873


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Abstract

Thickness measurements of thin transparent coatings on thick transparent bases by reflection interferometry are made possible through use of an immersion medium of the same refractive index as the base to intensify interference. A convenient interferometer comprising three essential parts, a “pocket” spectroscope, an incandescent lamp, and a cylindrical immersion tank, is described. Its use for rapid, precise measurements of thickness of single and double layer coatings and films in the range of 0.2 to 50 microns is illustrated with spectra.

Citation
M. F. BECHTOLD, "Coating Thickness Measurement by Interferometry," J. Opt. Soc. Am. 37, 873-876 (1947)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-37-10-873


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References

  1. H. Friedman and L. S. Birks, Rev, Sci. Inst. 17, 99 (1946).
  2. Gunn and Scott, Nature 158, 621 (1946).
  3. Plessner, Nature 158, 915 (1946).
  4. R. W. Wood, Physical Optics (The Macmillan Company, New York, 1934), third edition, p. 192.
  5. H. W. Straub, Alien Property Custodian No. 334, 220 (May 4, 1943).
  6. A. H. Pfund, J. Opt. Soc. Am. 36, 95 (1946).
  7. Jenkins and White, Fundamentals of Physical Optics McGraw-Hill Book Company, Inc., New York, 1937), first edition, p. 83.
  8. F. W. Billmeyer, Jr., Phys. Rev. 71, 489 (1947).
  9. A. H. Pfund, J. Opt. Soc. Am. 31, 679 (1941).

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