Abstract

The relative merits of the several methods available for the polarimetric determination of the ratio of the complex reflection coefficients of a surface are considered. These considerations are used to define the most satisfactory procedures under various conditions.

© 1951 Optical Society of America

Unified Analysis of Ellipsometry Errors Due to Imperfect Components, Cell-Window Birefringence, and Incorrect Azimuth Angles*

R. M. A. Azzam and N. M. Bashara
J. Opt. Soc. Am. 61(5) 600-607 (1971)

A Monochromatic Depolarizer*†

Bruce H. Billings
J. Opt. Soc. Am. 41(12) 966-975 (1951)

Effects of component optical activity in data reduction and calibration of rotating-analyzer ellipsometers

D. E. Aspnes
J. Opt. Soc. Am. 64(6) 812-819 (1974)

Analyses and Corrections of Instrumental Errors in Ellipsometry

FRANK L. MCCRACKIN
J. Opt. Soc. Am. 60(1) 57-63 (1970)

An Interferometric Method for the Determination of the Absorption Coefficients of Metals, with Results for Silver and Aluminum*

L. G. Schulz
J. Opt. Soc. Am. 41(12) 1047-1051 (1951)