The requirements of a satisfactory positive print method of measuring integrated x-ray diffraction intensities are discussed. An improved positive print process which covers a larger x-ray exposure range than that previously claimned for this method, and typical results obtained with it are described. Some precautions which should be observed in the application of the process are given.
R. L. GRIFFITH, "An Improved Positive Print Method for Measuring Integrated Intensities of X-Ray Diffraction Patterns," J. Opt. Soc. Am. 42, 31-32 (1952)