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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 42, Iss. 10 — Oct. 1, 1952
  • pp: 756–756

A Study in Diffraction Microscopy with Special Reference to X-Rays

ALBERT V. BAEZ  »View Author Affiliations


JOSA, Vol. 42, Issue 10, pp. 756-756 (1952)
http://dx.doi.org/10.1364/JOSA.42.000756


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Abstract

The factors which affect resolution in diffraction microscopy are studied. The inequality pλ>4nd/N is a necessary condition for making good holograms, where p is the distance between source and film, d is the diameter of the source, and λ is its wavelength, n is the number of recorded central bands of the diffraction pattern, and N is the resolving power of the film. The minimum theoretical resolvable distance between two point objects is limited by d and N but not by the wavelengths used in the analysis and reconstruction. Possible applications to the focusing of x-rays by Gabor techniques and by a single Fresnel zone plate are considered.

Citation
ALBERT V. BAEZ, "A Study in Diffraction Microscopy with Special Reference to X-Rays," J. Opt. Soc. Am. 42, 756-756 (1952)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-42-10-756


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References

  1. P. Kirkpatrick and A. V. Baez, J. Opt. Soc. Am. 38, 766 (1948).
  2. P. Kirkpatrick, J. Opt. Soc. Am. 39, 796 (1949).
  3. Ora E. Myers, Jr., Am. J. Phys. 19, 359 (1951).
  4. D. Gabor, Proc. Roy. Soc. (London) A197, 454 (1949).
  5. G. L. Rogers, Nature 166, 237 (1950).
  6. G. L. Rogers, Proc. Roy. Soc. (Edin.) A58, Part III, 193 (1950–51).

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