Abstract

A new, rapid, and accurate method for obtaining the order of interference in a Fabry-Perot etalon is discussed. Apparatus for using the method in calibrating end standards is described. Possible improvements and application to other measurements such as wavelength determinations are pointed out.

© 1954 Optical Society of America

A New Photoelectric Method for the Calibration of Retardation Plates

D. D. Randall
J. Opt. Soc. Am. 44(8) 600-602 (1954)

The Index of Refraction of Germanium Measured by an Interference Method*

D. H. Rank, H. E. Bennett, and D. C. Cronemeyer
J. Opt. Soc. Am. 44(1) 13-16 (1954)

Electronic Fringe Interpolator for an Optical Interferometer*

R. D. Huntoon, Albert Weiss, and Wray Smith
J. Opt. Soc. Am. 44(4) 264-269 (1954)

The Axicon: A New Type of Optical Element

John H. McLeod
J. Opt. Soc. Am. 44(8) 592-597 (1954)

Application of the Two-Beam Interference Microscope to the Study of Surfaces

W. L. Grube and S. R. Rouze
J. Opt. Soc. Am. 44(11) 851-860 (1954)