Abstract

The displacement of reflecting echelon fringes due to the envelope curve has been investigated theoretically. It is shown that, over the range in which measurements are likely to be made, envelope displacement is proportional to the distance from the single-order position, and experimental data confirming this have been obtained. The observed displacements are, however, about three times as great as those calculated, and the discrepancy is attributed to the error of figure of the echelon surface. Graphs have been drawn enabling the wavelength error to be rapidly assessed for a given source and echelon.

© 1955 Optical Society of America

Quantitative Method for Measuring the Resolution of a Large Grating*

D. H. Rank, J. N. Shearer, and Jean M. Bennett
J. Opt. Soc. Am. 45(9) 762-766 (1955)

Interferometric Measurement of Wave-Front Aberrations in Gratings and Echelles*

George W. Stroke
J. Opt. Soc. Am. 45(1) 30-35 (1955)

Multiple-Beam Fringes of Equal Chromatic Order. Part VII. Mechanism of Polishing Glass*

W. F. Koehler
J. Opt. Soc. Am. 45(12) 1015-1020 (1955)

Interferometric Control of Grating Ruling with Continuous Carriage Advance*

George R. Harrison and George W. Stroke
J. Opt. Soc. Am. 45(2) 112-121 (1955)

Multiple-Beam Fringes of Equal Chromatic Order. Part V. Fringe Fine-Structure

W. F. Koehler and W. C. White
J. Opt. Soc. Am. 45(11) 940-944 (1955)