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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 46, Iss. 11 — Nov. 1, 1956
  • pp: 994–994

Calculator for Thin Film Measurements

W. A. FEIBELMAN  »View Author Affiliations


JOSA, Vol. 46, Issue 11, pp. 994-994 (1956)
http://dx.doi.org/10.1364/JOSA.46.000994


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Abstract

The design and operation of a calculator for determining thin film thicknesses measured by the multiple beam interferometer method is described. A photograph of the instrument and layout of the calculator dial is included.

Citation
W. A. FEIBELMAN, "Calculator for Thin Film Measurements," J. Opt. Soc. Am. 46, 994-994 (1956)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-46-11-994


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References

  1. 1 S. Tolansky, Multiple Beam Interferometry (Clarendon Press, Oxford, 1948).
  2. Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).

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