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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 46, Iss. 11 — Nov. 1, 1956
  • pp: 994–994

Calculator for Thin Film Measurements

W. A. FEIBELMAN  »View Author Affiliations

JOSA, Vol. 46, Issue 11, pp. 994-994 (1956)

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The design and operation of a calculator for determining thin film thicknesses measured by the multiple beam interferometer method is described. A photograph of the instrument and layout of the calculator dial is included.

W. A. FEIBELMAN, "Calculator for Thin Film Measurements," J. Opt. Soc. Am. 46, 994-994 (1956)

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  1. 1 S. Tolansky, Multiple Beam Interferometry (Clarendon Press, Oxford, 1948).
  2. Scott, McLauchlan, and Sennett, J. Appl. Phys. 21, 843 (1950).

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