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Journal of the Optical Society of America

Journal of the Optical Society of America

  • Vol. 47, Iss. 7 — Jul. 1, 1957
  • pp: 649–652

Critical Comment on a Method for Determining Electron Trap Depths

C. H. HAAKE  »View Author Affiliations


JOSA, Vol. 47, Issue 7, pp. 649-652 (1957)
http://dx.doi.org/10.1364/JOSA.47.000649


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Abstract

A method proposed by Garlick and Gibson is often applied to determine the energy positions of traps in phosphors. A critical analysis of Garlick and Gibson’s method based on a mathematical determination of the applicable temperature range and on experimental evidence shows that the trap depths obtained are lower than those found by other methods. Especially the frequency-of-escape constants calculated subsequently contrast strongly to those determined by separate measurements.

Citation
C. H. HAAKE, "Critical Comment on a Method for Determining Electron Trap Depths," J. Opt. Soc. Am. 47, 649-652 (1957)
http://www.opticsinfobase.org/josa/abstract.cfm?URI=josa-47-7-649

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